System and method for affecting field emission properties of a field emission structure

• US 7,750,777 B2
• Filed: 10/01/2008
• Issued: 07/06/2010
• Est. Priority Date: 04/04/2008
• Status: Expired due to Fees

• Current Assignee: Correlated Magnetics Research, LLC
• Original Assignee: Cedar Ridge Research LLC
• Inventors: Fullerton, Larry W., Roberts, Mark D.
• Primary Examiner(s): Barrera, Ramon M
• Application Number:
  US12/243,864
• Publication Number:
  US 20090251238A1
• Time in Patent Office: 643 Days
• Field of Search: 335/285, 335302-306, 243/03, 310/90.5
• US Class Current: 335/306
• CPC Class Codes: H01F 41/02 for manufacturing cores, coils, or magnets H01F41/14 takes precedence; for dynamo-electric machines H02K15/00
• CPC Class Codes: H01F 7/0278 for generating uniform fields, focusing, deflecting electrically charged particles for magnetic separation by Lorentz force B03C1/023; specially adapted for NMR applications G01R33/383
• CPC Class Codes: H01F 7/0284 using a trimmable or adjustable magnetic circuit, e.g. for a symmetric dipole or quadrupole magnetic field
• CPC Class Codes: H01L 27/0266 using field effect transistors as protective elements
• CPC Class Codes: H01P 11/00 Apparatus or processes specially adapted for manufacturing waveguides or resonators, lines, or other devices of the waveguide type
• CPC Class Codes: Y10T 24/32 having magnetic fastener
• CPC Class Codes: Y10T 29/49016 Antenna or wave energy "plumbing" making
• CPC Class Codes: Y10T 29/4902 Electromagnet, transformer or inductor
• CPC Class Codes: Y10T 29/49073 by assembling coil and core
• CPC Class Codes: Y10T 29/49075 including permanent magnet or core
• CPC Class Codes: Y10T 29/49826 Assembling or joining
• CPC Class Codes: Y10T 29/49904 Assembling a subassembly, then assembling with a second subassembly
• CPC Class Codes: Y10T 29/53091 for work-holder for assembly or disassembly
• CPC Class Codes: Y10T 29/5313 Means to assemble electrical device
• CPC Class Codes: Y10T 29/53265 with work-holder for assembly

Abstract

An improved field emission system and method is provided that involves field emission structures having electric or magnetic field sources. The magnitudes, polarities, and positions of the magnetic or electric field sources are configured to have desirable correlation properties, which may be in accordance with a code. The correlation properties correspond to a desired spatial force function where spatial forces between field emission structures correspond to relative alignment, separation distance, and the spatial force function.

Claims

1. A system for affecting field emission properties, comprising:

a first magnetic field emission structure, said first magnetic field emission structure having a spatial force function based on its relative alignment with a second magnetic field emission structure; and

at least one intermediate element associated with said first magnetic field structure, said at least one intermediate element affecting field emission properties of said first magnetic field emission structure, said spatial force function being in accordance with a code, said code corresponding to a code modulo of said first magnetic field emission structure and a complementary code modulo of said second magnetic field emission structure, said code defining a peak spatial force corresponding to substantial alignment of said code modulo of said first magnetic field emission structure with said complementary code modulo of said second magnetic field emission structure, said code also defining a plurality of off peak spatial forces corresponding to a plurality of different misalignments of said code modulo of said first magnetic field emission structure and said complementary code modulo of said magnetic field emission structure, said plurality of off peak spatial forces having a largest off peak spatial force, said largest off peak spatial force being less than half of said peak spatial force.

2. The system of claim 1, wherein said at least one intermediate element comprises at least one of an active intermediate layer, a saturable layer, or an inactive layer.

3. The system of claim 1, wherein said at least one intermediate element comprises at least one of iron, air, or plastic.

4. The system of claim 1, wherein said at least one intermediate element suppresses spatial forces when said first field emission structure and said second field emission structure are brought together.

5. The system of claim 1, wherein said at least one intermediate element substantially shields side lobe effects of said spatial force function.

6. The system of claim 1, wherein at least one of said first field emission structure or said second field emission structure comprises at least one of an electric field emission structure or a magnetic field emission structure.

7. The system of claim 1, wherein said at least one intermediate element comprises a first intermediate element on one side of said first field emission structure and a second intermediate element on a second side of said first magnetic field emission structure.

8. A method for affecting field emission properties, comprising the steps of:

providing a first magnetic field emission structure, said first magnetic field emission structure having a spatial force function based on its relative alignment with a second magnetic field emission structure; and

associating at least one intermediate element with said first magnetic field structure, said at least one intermediate element affecting field emission properties of said first magnetic field emission structure, said spatial force function being in accordance with a code, said code corresponding to a code modulo of said first magnetic field emission structure and a complementary code modulo of said second magnetic field emission structure, said code defining a peak spatial force corresponding to substantial alignment of said code modulo of said first magnetic field emission structure with said complementary code modulo of said second magnetic field emission structure, said code also defining a plurality of off peak spatial forces corresponding to a plurality of different misalignments of said code modulo of said first magnetic field emission structure and said complementary code modulo of said magnetic field emission structure, said plurality of off peak spatial forces having a largest off peak spatial force, said largest off peak spatial force being less than half of said peak spatial force.

9. The method of claim 8, wherein said at least one intermediate element comprises at least one of an active intermediate layer, a saturable layer, or an inactive layer.

10. The method of claim 8, wherein said at least one intermediate element comprises at least one of iron, air, or plastic.

11. The method of claim 8, wherein said at least one intermediate element suppresses spatial forces when said first field emission structure and said second field emission structure are brought together.

12. The method of claim 8, wherein said at least one intermediate element substantially shields side lobe effects of said spatial force function.

13. The method of claim 8, wherein at least one of said first field emission structure or said second field emission structure comprises at least one of an electric field emission structure or a magnetic field emission structure.

14. The method of claim 8, wherein said at least one intermediate element comprises a first intermediate element on one side of said first field emission structure and a second intermediate element on a second side of said first magnetic field emission structure.

15. A system for affecting field emission properties, comprising:

a first field emission structure;

a second field emission structure, said first field emission structure and said second field structure having a spatial force function based on their relative alignment; and

at least one intermediate element associated with at least one of said first field emission structure or said second field emission structure, said at least one intermediate element affecting said spatial force function, said spatial force function being in accordance with a code, said code corresponding to a code modulo of said first field emission structure and a complementary code modulo of said second field emission structure, said code defining a peak spatial force corresponding to substantial alignment of said code modulo of said first field emission structure with said complementary code modulo of said second field emission structure, said code also defining a plurality of off peak spatial forces corresponding to a plurality of different misalignments of said code modulo of said first field emission structure and said complementary code modulo of said field emission structure, said plurality of off peak spatial forces having a largest off peak spatial force, said largest off peak spatial force being less than half of said peak spatial force.

16. The system of claim 15, wherein said at least one intermediate element comprises at least one of an active intermediate layer, a saturable layer, an inactive layer, iron, air, or plastic.

17. The system of claim 15, wherein said at least one intermediate element suppresses spatial forces when said first field emission structure and said second field emission structure are brought together.

18. The system of claim 15, wherein said at least one intermediate element substantially shields side lobe effects of said spatial force function.

19. The system of claim 15, wherein at least one of said first field emission structure or said second field emission structure comprises at least one of an electric field emission structure or a magnetic field emission structure.

20. The system of claim 15, wherein said at least one intermediate element comprises a first intermediate element on one side of said first field emission structure and a second intermediate element on a second side of said first field emission structure.