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High-frequency measuring system having spatially separated high-frequency modules

  • US 7,756,516 B2
  • Filed: 05/27/2004
  • Issued: 07/13/2010
  • Est. Priority Date: 06/30/2003
  • Status: Active Grant
First Claim
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1. A high-frequency measuring system for measuring a device under test, comprising:

  • a measuring-device unit; and

    a first high-frequency module including a transmitter device configured to communicate with the device under test and a second high-frequency module including a receiver device configured to communicate with the device under test, wherein each high-frequency module is placed spatially separated from the measuring-device unit and each high-frequency module is connected to the measuring-device unit via a digital interface,wherein the measuring-device unit is configured to process input data input into the measuring-device unit to form a bitstream for transmission via the digital interface to the first high-frequency module, and the first high-frequency module is configured to subsequently forward the bitstream to the device under test using the transmitter device, the processing of the input data including assigning symbols to states in a state diagram of an I-Q (in phase-quadrature phase) level in the measuring-device unit,wherein one or more of the first high-frequency module and the second high-frequency module includes a local oscillator, and wherein the one or more high-frequency module including the local oscillator is provided in a housing that is separate from a housing of the measuring-device unit.

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