Structure and method for improving shielded gate field effect transistors
First Claim
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1. A field effect transistor comprising:
- a trench extending into a drift region of the field effect transistor;
a shield electrode in a lower portion of the trench, wherein the shield electrode is insulated from the drift region by a shield dielectric;
a gate electrode in the trench over the shield electrode, wherein the gate electrode is insulated from the shield electrode by an inter-electrode dielectric;
source regions adjacent the trench;
a source metal contacting the source regions; and
a resistive element having one end contacting the shield electrode and another end contacting the source metal in the field effect transistor.
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Abstract
A field effect transistor is disclosed. In one embodiment, the field effect transistor includes a trench extending into a drift region of the field effect transistor. A shield electrode in a lower portion of the trench is insulated from the drift region by a shield dielectric. A gate electrode in the trench over the shield electrode is insulated from the shield electrode by an inter-electrode dielectric. A source region is formed adjacent the trench. A resistive element is coupled to the shield electrode and to a source region in the field effective transistor.
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Citations
28 Claims
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1. A field effect transistor comprising:
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a trench extending into a drift region of the field effect transistor; a shield electrode in a lower portion of the trench, wherein the shield electrode is insulated from the drift region by a shield dielectric; a gate electrode in the trench over the shield electrode, wherein the gate electrode is insulated from the shield electrode by an inter-electrode dielectric; source regions adjacent the trench; a source metal contacting the source regions; and a resistive element having one end contacting the shield electrode and another end contacting the source metal in the field effect transistor. - View Dependent Claims (2, 3, 4, 5, 23, 24, 25)
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6. A semiconductor device comprising:
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a drift region of a first conductivity type; a well region extending above the drift region and having a second conductivity type opposite the first conductivity type; a trench extending through the well region and into the drift region, the trench having its sidewalls and bottom lined with dielectric material, the trench further including a shield conductive layer and a gate conductive layer above the shield conductive layer, the shield conductive layer being separated from the gate conductive layer by an inter-electrode dielectric material; source regions having the first conductivity type formed in the well region adjacent to the trench; a source metal contacting the source regions; and a resistive element having one end contacting the shield conductive layer and another end contacting the source metal. - View Dependent Claims (7, 8, 9, 10, 11, 12, 13, 14, 15, 16)
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17. A field effect transistor comprising:
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a plurality of trenches extending into a drift region; a shield electrode in a lower portion of each trench, wherein the shield electrode is insulated from the drift region by a shield dielectric; a gate electrode in each trench over the shield electrode, wherein the gate electrode is insulated from the shield electrode by an inter-electrode dielectric; source regions adjacent the trenches; a source metal contacting the source regions; and a resistive element having one end contacting the shield electrode and another end contacting the source metal. - View Dependent Claims (26, 27, 28)
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18. A method of forming a field effect transistor comprising:
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forming a plurality of trenches in a drift region; forming a shield electrode in a lower portion of each trench, the shield electrode being insulated from the drift region by a shield dielectric; forming a gate electrode in each trench over the shield electrode, the gate electrode being insulated from the shield electrode by an inter-electrode dielectric; forming source regions adjacent the trenches; forming a source metal contacting the source regions; and forming a resistive element having one end contacting the shield electrode and another end contacting the source metal. - View Dependent Claims (19, 20, 21, 22)
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Specification