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Method for analyzing multi-layer materials from one-sided pulsed thermal imaging

  • US 7,769,201 B2
  • Filed: 06/13/2006
  • Issued: 08/03/2010
  • Est. Priority Date: 06/13/2006
  • Status: Expired due to Fees
First Claim
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1. A computer-implemented method for automated analysis of thermal imaging data for multi-layer materials comprising the steps of:

  • a computer forstoring a plurality of model solutions for a multi-layer material system;

    acquiring experimental thermal imaging data;

    said experimental thermal imaging data including test and sample parameters, said test and sample parameters including a heat capacity of each layer of the multi-layer materials;

    fitting a model solution with the experimental thermal imaging data by adjusting the model parameters including thermal properties and thickness of each layer;

    responsive to the model result matching the experimental thermal imaging data, identifying thermal properties and thickness parameters for the multi-layer materials; and

    responsive to the identified thermal properties and thickness parameters for the multi-layer materials, constructing thickness, thermal conductivity, and absorption maps for the multi-layer materials.

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