Fast-scanning SPM and method of operating same
First Claim
Patent Images
1. A method of operating a scanning probe microscope (SPM) comprising:
- actuating a piezoelectric actuator assembly to move a probe of the SPM to scan the probe past a sample through a scan range of at least 4 microns at a rate of at least 30 lines/sec and moving the probe in z a direction under control of a piezoelectric z actuator;
measuring motion of the probe using a sensing light beam and a detector;
moving at least one lens so that the sensing beam at least substantially follows the scanning motion of the probe; and
controlling probe-sample interaction with a force control slew rate of at least 1 mm/sec; and
at least one of storing, transmitting, and displaying at least one of the measurement and information derived from the measurement.
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Abstract
A method and apparatus are provided that have the capability of rapidly scanning a large sample of arbitrary characteristics under force control feedback so has to obtain a high resolution image. The method includes generating relative scanning movement between a probe of the SPM and a sample to scan the probe through a scan range of at least 4 microns at a rate of at least 30 lines/sec and controlling probe-sample interaction with a force control slew rate of at least 1 mm/sec. A preferred SPM capable of achieving these results has a force controller having a force control bandwidth of at least closed loop bandwidth of at least 10 kHz.
106 Citations
26 Claims
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1. A method of operating a scanning probe microscope (SPM) comprising:
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actuating a piezoelectric actuator assembly to move a probe of the SPM to scan the probe past a sample through a scan range of at least 4 microns at a rate of at least 30 lines/sec and moving the probe in z a direction under control of a piezoelectric z actuator; measuring motion of the probe using a sensing light beam and a detector; moving at least one lens so that the sensing beam at least substantially follows the scanning motion of the probe; and controlling probe-sample interaction with a force control slew rate of at least 1 mm/sec; and at least one of storing, transmitting, and displaying at least one of the measurement and information derived from the measurement. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14)
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15. A method of operating a scanning probe microscope (SPM) comprising:
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actuating a piezoelectric actuator assembly to move a probe of the SPM past a sample to scan the probe through a scan range of at least 4 microns at a rate of at least 30 lines/sec and moving the probe in a z direction under control of a piezoelectric z actuator; measuring motion of the probe using a sensing light beam and a detector; moving at least one lens so that the sensing beam at least substantially follows the scanning motion of the probe; and controlling probe-sample interaction with a force control bandwidth of at least 10 kHz; and at least one of storing, transmitting, and displaying at least one of the measurement and information derived from the measurement. - View Dependent Claims (16, 17, 18, 19)
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20. A scanning probe microscope (SPM) comprising:
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a piezoelectric actuator assembly that moves probe of the SPM past a sample to scan the probe through a scan range of at least 4 microns at a rate of at least 30 lines/sec; a piezoelectric actuator that moves the probe in a z direction; means for measuring motion of the probe using a sensing light beam and a detector; means for moving at least one lens so that the sensing beam at least substantially follows the scanning motion of the probe; and means for controlling probe-sample interaction with a force control slew rate of at least 1 mm/sec. - View Dependent Claims (21)
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22. A scanning probe microscope (SPM) comprising:
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a scanner including
1) a piezoelectric actuator assembly that moves a probe of the SPM past a sample to scan the probe through a scan range of at least 4 microns at a rate of at least 30 lines/sec and
2) a piezoelectric actuator that moves the probe in a z direction;a sensing light beam and detector that measure motion of the probe; at least one lens disposed between the scanning light beam and the sample, the lens being movable to cause the sensing beam to at least substantially follow the scanning motion of the probe; and a controller that controls probe-sample interaction with a force control slew rate of at least 1 mm/sec. - View Dependent Claims (23, 24, 25, 26)
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Specification