Test operation of multi-port memory device

• US 7,773,439 B2
• Filed: 12/28/2006
• Issued: 08/10/2010
• Est. Priority Date: 04/13/2006
• Status: Active Grant

• Current Assignee: Hynix Semiconductor Incorporated (SK Hynix Inc.)
• Original Assignee: Hynix Semiconductor Incorporated (SK Hynix Inc.)
• Inventors: Do, Chang-Ho, Chung, Jin-Il
• Primary Examiner(s): DINH, SON T
• Application Number:
  US11/647,625
• Publication Number:
  US 20070245093A1
• Time in Patent Office: 1,321 Days
• Field of Search: 365/201, 365/230.05, 365/189.02, 365/230.06, 365/220, 365/221
• US Class Current: 365/201
• CPC Class Codes: G11C 2207/107 Serial-parallel conversion of data or prefetch
• CPC Class Codes: G11C 29/1201 comprising I/O circuitry
• CPC Class Codes: G11C 29/14 Implementation of control logic, e.g. test mode decoders
• CPC Class Codes: G11C 29/48 Arrangements in static stores specially adapted for testing by means external to the store, e.g. using direct memory access [DMA] or using auxiliary access paths
• CPC Class Codes: G11C 7/1012 Data reordering during input/output, e.g. crossbars, layers of multiplexers, shifting or rotating
• CPC Class Codes: G11C 7/1075 for multiport memories each having random access ports and serial ports, e.g. video RAM

Abstract

A multi-port memory device includes a plurality ports, a plurality of banks, a plurality of global data buses, first and second I/O controllers, and a test input/output (I/O) controller. The ports perform a serial I/O data transmission. The banks perform a parallel I/O data transmission with the ports. The global data buses are employed for transmitting data between the ports and the banks. The first I/O controller controls a serial data transmission between the ports and external devices. The second I/O controller controls a parallel data transmission between the ports and the global buses. The test I/O controller generates test commands based on a test command/address (C/A) inputted from the external devices and transmits a test I/O data with the global data bus during a test operation mode.

Claims

1. A multi-port memory device, comprising:

a plurality ports for performing a serial input/output (I/O) data transmission;

a plurality of I/O pads coupled to the ports;

a plurality of banks for performing a parallel I/O data transmission with the ports;

a plurality of global data buses for transmitting data between the ports and the banks;

a test I/O controller for transmitting a test signal and a test input signal to the banks through the global data buses without passing through the ports and transmitting a test output signal from the banks in response to the test signal through the global data buses during a test operation mode.

2. The multi-port memory device as recited in claim 1, wherein each of the I/O pads includes:

a general I/O pad for receiving the test signal during the test operation; and

a test I/O pad for receiving the test input signal and outputting the test output signal.

3. The multi-port memory device as recited in claim 2, wherein the test signal is input to the general I/O pad in parallel.

4. The multi-port memory device as recited in claim 1, wherein the global data buses include:

a first global data bus for receiving the test signal and the test input signal from the test I/O controller; and

a second global data bus for transmitting the test output signal to the test I/O controller.

5. A multi-port memory device, comprising:

a plurality ports for performing a serial input/output (I/O) data transmission;

a plurality of banks for performing a parallel I/O data transmission with the ports;

a plurality of global data buses for transmitting data between the ports and the banks;

a first I/O controller for controlling a serial data transmission between the ports and external devices;

a second I/O controller for controlling a parallel data transmission between the ports and the global buses; and

a test I/O controller for generating test commands based on a test command/address (C/A) inputted from the external devices and transmitting a test I/O data through the global data bus during a test operation mode.

6. The multi-port memory device as recited in claim 5, wherein the first I/O controller transmits data between the ports and the external devices during a normal operation mode and blocks the serial data transmission during the test operation mode in response to a test enable signal enabled during the test operation mode.

7. The multi-port memory device as recited in claim 5, wherein the first I/O controller includes:

a first tri-state buffer for controlling a data transmission from the external devices to the ports; and

a second tri-state buffer for controlling a data transmission from the ports to the external devices.

8. The multi-port memory device as recited in claim 5, wherein the test I/O controller includes:

a command decoder for decoding the test C/A to thereby generate an internal read command and an internal write command, buffering and outputting the test C/A and a bank address, and generating a global data bus selection signal;

a first multiplexer (MUX) for outputting the test C/A, the bank address, and the test I/O data as a test input signal in response to the internal write command;

a demultiplexer (DEMUX) for transmitting the test input signal to the second I/O controller in response to the global data bus selection signal;

a second MUX for outputting a test output signal transmitted from the global data bus in response to the global data bus selection signal; and

a third tri-state buffer for outputting the test output signal in response to the internal read command.

9. The multi-port memory device as recited in claim 8, wherein the command decoder is controlled by the test enable signal.

10. The multi-port memory device as recited in claim 8, wherein the second I/O controller includes:

a fourth tri-state buffer for controlling a data transmission from the global data bus to the ports in response to the test enable signal; and

a third MUX for selecting one of the test input signal and the data transmitted from the ports in response to the test enable signal and outputting the selected one to the global data bus.

11. The multi-port memory device as recited in claim 5, wherein each global data bus is provided with a plurality of first global data buses employed for a data transmission from the banks to the ports and a plurality of second global data buses employed for a data transmission from the ports to the banks.

12. The multi-port memory device as recited in claim 8, wherein the test I/O controller includes:

a column decoder for decoding the test C/A to thereby generate an internal read command and an internal write command, buffering and outputting the test C/A and a bank address, and generating first and second global data bus selection signals;

a first multiplexer (MUX) for outputting the test C/A, the bank address, and the test I/O data as a test input signal in response to the internal write command;

a demultiplexer (DEMUX) for transmitting the test input signal to the second I/O controller in response to the second global data bus selection signal;

a second MUX for outputting a test output signal transmitted from the first global data bus in response to the first global data bus selection signal; and

a third tri-state buffer for outputting the test output signal in response to the internal read command.

13. The multi-port memory device as recited in claim 12, wherein the second I/O controller includes:

a fourth tri-state buffer for controlling a data transmission from the first global data bus to the ports in response to the test enable signal; and

a third MUX for selecting one of the test input signal and the data transmitted from the ports in response to the test enable signal and outputting the selected one to the second global data bus.

14. A multi-port memory device, comprising:

a plurality of I/O pads;

a plurality ports performing a serial input/output (I/O) data transmission with external devices through the I/O pads;

a plurality of global data buses transmitting data between the ports and the banks;

a plurality of banks performing a parallel I/O data transmission with the ports through the global data buses;

a first I/O controller for controlling a serial data transmission between the ports and external devices;

a second I/O controller for controlling a parallel data transmission between the ports and the global buses; and

a test I/O controller for generating test commands based on a test command/address (C/A) inputted from the external devices and transmitting a test I/O data with the global data bus during a test operation mode.

15. The multi-port memory device as recited in claim 14, wherein the I/O pads are used for a serial I/O interface for a normal operation mode and used for a parallel I/O interface for the test operation mode.