ZQ calibration controller and method for ZQ calibration
First Claim
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1. A ZQ calibration controller of a semiconductor memory device, comprising:
- a first signal generator for generating a pre-calibration signal during an initialization of the semiconductor memory device, wherein the pre-calibration signal is generated in response to an initialization signal whose logic level changes during the initialization;
a second signal generator for generating ZQ calibration signals in response to a ZQ calibration command; and
a control unit for outputting signals to control a ZQ calibration in response to the pre-calibration signal and the ZQ calibration signals.
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Abstract
A ZQ calibration circuit performs a ZQ calibration additionally in an initial operation of a semiconductor memory device. The ZQ calibration controller of the ZQ calibration circuit includes a first signal generator, a second signal generator, and a control unit. The first signal generator generates a pre-calibration signal during an initialization of the semiconductor memory device. The second signal generator generates ZQ calibration signals in response to a ZQ calibration command. The control unit outputs signals to control a ZQ calibration in response to the pre-calibration signal and the ZQ calibration signals.
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Citations
18 Claims
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1. A ZQ calibration controller of a semiconductor memory device, comprising:
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a first signal generator for generating a pre-calibration signal during an initialization of the semiconductor memory device, wherein the pre-calibration signal is generated in response to an initialization signal whose logic level changes during the initialization; a second signal generator for generating ZQ calibration signals in response to a ZQ calibration command; and a control unit for outputting signals to control a ZQ calibration in response to the pre-calibration signal and the ZQ calibration signals. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. A ZQ calibration circuit of a semiconductor memory device, comprising:
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a ZQ calibration unit for performing a ZQ calibration; a ZQ calibration controller for activating the ZQ calibration unit in response to a ZQ calibration command; and a pre-calibration controller for activating the ZQ calibration unit in response to an initializing signal whose logic level changes during an initialization of the semiconductor memory device. - View Dependent Claims (13, 14, 15)
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16. A method for performing a ZQ calibration of a semiconductor memory device, the method comprising:
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performing a pre-calibration in response to an initializing signal whose logic level changes during an initialization of the semiconductor memory device; and performing a ZQ calibration in response to a ZQ calibration command. - View Dependent Claims (17, 18)
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Specification