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Analysis system

  • US 7,774,166 B2
  • Filed: 11/02/2007
  • Issued: 08/10/2010
  • Est. Priority Date: 01/18/2002
  • Status: Expired due to Term
First Claim
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1. An apparatus for analyzing the condition of a machine having a rotating shaft, comprising:

  • a plurality of inputs for receiving measurement data from sensors for surveying measuring points of the machine, said measurement data being dependent on rotation of said shaft;

    data processing means for processing condition data dependent on said measurement data, said data processing means comprising;

    means for performing a plurality of condition monitoring functions (F1, F2, Fn);

    a first data processing device (50A) and a second data processing device (50B), said second data processing device being a Field Programmable Gate Array circuit coupled to said plurality of inputs; and

    at least one memory (60) having a plurality of memory segments (70, 90, 110, 120) for storing program code, said program code including first program code means (80), stored on at least one (70) of said memory segments, for execution by said first data processing device (50A);

    wherein said first data processing device (50A) operates to execute said first program code means (80);

    wherein said first program code means, when executed on said first data processing device (50A) causes the first data processing device to control the operation of the Field Programmable Gate Array circuit (50B) so as to determine which of said plurality of condition monitoring functions (F1, F2, Fn) are to be executed by the Field Programmable Gate Array circuit 50B;

    wherein said at least one memory (60) further comprises;

    second program code means (100), stored on one (90) of said memory segments, which when run on said Field Programmable Gate Array circuit (50B) causes the condition analysis apparatus to execute a first condition monitoring function (F1, F2, Fn); and

    third program code means, stored on one (120) of said memory segments, which when run on said Field Programmable Gate Array circuit (50B) causes the condition analysis apparatus to execute a second condition monitoring function (F1, F2, Fn); and

    wherein said apparatus is adapted to allow parallel processing of said second program code means and said third program code means on said Field Programmable Gate Array circuit (50B) so as to achieve simultaneous execution of at least two condition monitoring functions.

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