Semiconductor device and manufacturing method thereof
First Claim
1. A method for manufacturing a semiconductor device, comprising:
- forming a first sacrifice layer in a first region over an insulating surface;
forming a layer containing silicon in a second region of the insulating surface and over the first sacrifice layer in the first region;
forming a structural layer in the first region and a semiconductor layer in the second region by patterning the layer containing silicon;
forming a first insulating layer over the structural layer and the semiconductor layer;
forming a conductive layer over the first insulating layer;
forming a gate electrode in the second region by patterning the conductive layer; and
forming a first space between the insulating surface and the structural layer by etching the first sacrifice layer.
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Abstract
It has been difficult to manufacture a semiconductor device equipped with a microstructure having a space, an electric circuit for controlling the microstructure, and the like over one substrate. In a semiconductor device, a microstructure and an electric circuit for controlling the microstructure can be provided over one substrate by manufacturing the microstructure in such a way that a structural layer having polycrystalline silicon obtained by laser* crystallization or thermal crystallization using a metal element is formed and processed at low temperature. As the electric circuit, a wireless communication circuit for carrying out wireless communication with an antenna is given.
76 Citations
30 Claims
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1. A method for manufacturing a semiconductor device, comprising:
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forming a first sacrifice layer in a first region over an insulating surface; forming a layer containing silicon in a second region of the insulating surface and over the first sacrifice layer in the first region; forming a structural layer in the first region and a semiconductor layer in the second region by patterning the layer containing silicon; forming a first insulating layer over the structural layer and the semiconductor layer; forming a conductive layer over the first insulating layer; forming a gate electrode in the second region by patterning the conductive layer; and forming a first space between the insulating surface and the structural layer by etching the first sacrifice layer. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15)
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16. A method for manufacturing a semiconductor device, comprising:
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forming a layer containing silicon in a first region and a second region over a same insulating surface; forming a lower layer in the first region and a semiconductor layer in the second region by patterning the layer containing silicon; forming a first insulating layer over the lower layer; forming a first sacrifice layer over the lower layer containing silicon in the first region; forming a first conductive layer over the first insulating layer; forming a structural layer in the first region and a gate electrode in the second region by patterning the first conductive layer; and forming a first space between the lower layer containing silicon and the structural layer by etching the first sacrifice layer. - View Dependent Claims (17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30)
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Specification