Testing and recovery in a multilayer device
First Claim
1. A system comprising:
- an underlying circuit;
an auxiliary circuit mounted on the underlying circuit;
a plurality of micro-scale interconnects configured to electrically connect the underlying circuit to the auxiliary circuit;
a plurality of excess micro-scale interconnects configured for replacing micro-scale interconnects found to be defective; and
an interface within the underlying circuit and configured for testing the auxiliary circuit or the plurality of micro-scale interconnects.
4 Assignments
0 Petitions
Accused Products
Abstract
Disclosed are systems and methods of producing electronic devices including an auxiliary circuit mounted on another, underlying, circuit at the wafer level. The auxiliary circuit is electrically connected to the underlying circuit via micro-scale interconnects. The systems are capable of testing the auxiliary circuit and/or interconnects using an interface within the underlying circuit. For example, the auxiliary circuit may be tested although it is mounted such that the interconnects are hidden, i.e., inaccessible for testing purposes after assembly using conventional testing systems and methods.
The systems and methods further allow for including excess circuits and/or excess interconnects that can be reconfigured to replace parts of the auxiliary circuit and/or micro-scale interconnects found defective during testing.
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Citations
23 Claims
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1. A system comprising:
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an underlying circuit; an auxiliary circuit mounted on the underlying circuit; a plurality of micro-scale interconnects configured to electrically connect the underlying circuit to the auxiliary circuit; a plurality of excess micro-scale interconnects configured for replacing micro-scale interconnects found to be defective; and an interface within the underlying circuit and configured for testing the auxiliary circuit or the plurality of micro-scale interconnects. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
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13. A method comprising:
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mounting an auxiliary circuit on an underlying circuit via a plurality of micro-scale interconnects; thereafter using an interface within the underlying circuit to generate first test results data configured to test parts of the auxiliary circuit or parts of the plurality of micro-scale interconnects; and replacing micro-scale interconnects found to be defective with the excess micro-scale interconnects. - View Dependent Claims (14, 15, 16, 17, 18, 19, 20)
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21. An integrated circuit system comprising:
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an underlying circuit; an auxiliary circuit mounted on the underlying circuit; a plurality of excess circuits included in the underlying circuit or the auxiliary circuit, and configured for replacing parts of the auxiliary circuit found to be defective through testing of the auxiliary circuit; and a plurality of micro-scale interconnects configured to electrically connect the underlying circuit to the auxiliary circuit and configured for replacing micro-scale interconnects found to be defective. - View Dependent Claims (22, 23)
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Specification