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Testing and recovery in a multilayer device

  • US 7,779,311 B2
  • Filed: 10/04/2006
  • Issued: 08/17/2010
  • Est. Priority Date: 10/24/2005
  • Status: Active Grant
First Claim
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1. A system comprising:

  • an underlying circuit;

    an auxiliary circuit mounted on the underlying circuit;

    a plurality of micro-scale interconnects configured to electrically connect the underlying circuit to the auxiliary circuit;

    a plurality of excess micro-scale interconnects configured for replacing micro-scale interconnects found to be defective; and

    an interface within the underlying circuit and configured for testing the auxiliary circuit or the plurality of micro-scale interconnects.

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