Method for measuring volume by an optical surface profilometer in a micromechanical device and a system for carrying out said measurement

• US 7,782,467 B2
• Filed: 01/24/2006
• Issued: 08/24/2010
• Est. Priority Date: 01/25/2005
• Status: Expired due to Fees

• Current Assignee: Debiotech S.A.
• Original Assignee: Debiotech S.A.
• Inventors: Chappel, Eric
• Primary Examiner(s): Chowdhury; Tarifur
• Assistant Examiner(s): COOK, JONATHON
• Application Number:
  US11/814,661
• Publication Number:
  US 20090097037A1
• Time in Patent Office: 1,673 Days
• Field of Search: 356/497, 356/498, 356/511, 356/516, 356/614, 356/627, 356/601
• US Class Current: 356/511
• CPC Class Codes: G01F 22/00 Methods or apparatus for measuring volume of fluids or fluent solid material, not otherwise provided for

Abstract

A method of measuring a volume in a fluid flow micromechanical device includes: a) providing and positioning an optical apparatus for measuring the profile of a surface; b) providing a device for acquiring and processing the images coming from the optical apparatus for measuring a profile; c) placing the moving member in a first position and then in a second position, and activating the optical apparatus for measuring the profile of the surface to direct a light beam on the reference face, and activating the image acquisition and processor device to obtain a first image in the first position of the moving member and a second image in the second position; and d) comparing the second image with the first image of the reference face to determine the variation in the volume of the cavity generated by the deformation of the moving member.

Claims

1. A method of measuring a volume in a fluid flow micromechanical device by optically measuring the profile of a surface therein, said micromechanical device comprising a stack covered by a transparent closure plate, said stack comprising a support plate and a silicon wafer covering said support plate and itself covered by the closure plate, at least one cavity being formed between said closure plate and said silicon wafer, a moving member formed in the silicon wafer being suitable for moving towards and away from the support plate respectively between first and second positions that define a variation in the volume of said cavity, the method comprising:

a) providing and positioning an optical profile measuring apparatus for measuring a profile of a surface in such a manner that a face of the moving member facing towards the closure plate is a reference face for the measurement;

b) providing image acquisition and processor means enabling images coming from the optical profile measuring apparatus to be acquired and processed;

c) placing said moving member in said first position and activating said optical profile measuring apparatus for measuring the profile of the surface to direct a light beam on said reference face; and

activating the image acquisition and processor means to obtain a first image of said reference face in said first position of the moving member;

d) placing said moving member in said second position and activating said optical profile measuring apparatus for measuring the profile of the surface to direct a light beam on said reference face; and

activating the image acquisition and processor means to obtain a second image of said reference face in said second position of the moving member; and

e) comparing said second image with said first image of said reference face to determine the variation in the volume of the cavity caused by the deformation of the moving member.

2. The method according to claim 1, wherein said optical profile measuring apparatus for measuring the profile of a surface is an interferometer operating either with white light by detecting the coherence maximum of two polychromatic wavefronts, or with monochromatic light by using phase shifting interferometry (PSI), or by operating as a digital holographic microscope so that said first and second images are interference images.

3. A The method according to claim 2, wherein the optical profile measuring apparatus for measuring the profile of a surface includes a reference mirror and in that, during step a), a compensating plate that is optically equivalent to said transparent closure plate is placed on said reference mirror.

4. The method according to claim 1, wherein said optical profile measuring apparatus for measuring the profile of a surface is an instrument operating on the principle of confocal microscopy.

5. The method according to claim 1, wherein said micromechanical device is a micropump, in that said cavity is a pump chamber, in that said moving member is a membrane, and in that the variation in the volume of the pump chamber is measured, between the first position of the membrane referred to as the low position, that is reached when said membrane terminates its movement away from the closure plate, and the second position of the membrane corresponding to a high position reached when said membrane terminates its movement towards the closure plate.

6. The method according to claim 1, wherein at least one of said first position is reached when said moving member is in mechanical abutment with said closure plate and said second position is reached when said moving member is in mechanical abutment with said closure plate.

7. A measurement assembly for measuring volume by optically measuring a profile of a surface in a fluid flow micromechanical device, said measurement assembly comprising:

a micromechanical device comprising a stack covered by a transparent closure plate, said stack comprising a support plate and a silicon wafer covering said support plate and itself covered by said closure plate, at least one cavity being formed between said closure plate and said silicon wafer, a moving member formed in the silicon wafer being suitable for moving towards and away from the support plate between first and second positions that define a variation in the volume of said cavity;

an optical profile measuring apparatus for optically measuring the profile of a surface, the optical profile measuring apparatus being mounted in such a manner that the face of the moving member facing towards the closure plate is a reference face for measurement when a light beam is directed onto the fluid flow micromechanical device; and

image acquisition and processor means enabling images coming from the optical profile measuring apparatus to be acquired and processed and enabling the variation in the volume of the cavity generated by deformation of the moving member to be determined by comparing a first image of said reference face in said first position of the moving member with a second image of said reference face in said second position of the moving member.

8. The measurement assembly according to claim 7, wherein said optical profile measuring apparatus for measuring the profile of a surface is an interferometer operating either with white light by detecting the coherence maximum of two polychromatic wavefronts, or with monochromatic light by using phase shifting interferometry (PSI), or by operating as a digital holographic microscope so that said first and second images are interference images.

9. The measurement assembly according to claim 8, wherein said optical profile measuring apparatus for measuring the profile of a surface includes a reference mirror and in that a compensating plate that is optically equivalent to said transparent closure plate is placed on said reference mirror.

10. The measurement assembly according to claim 7, wherein said optical profile measuring apparatus for measuring the profile of a surface is an instrument operating on the principle of confocal microscopy.

11. The measurement assembly according to claim 7, wherein said micromechanical device is a micropump, in that said cavity is a pump chamber, in that said moving member is a membrane, and in that variation in the volume of the pump chamber is measured between the first position of the membrane and the second position of the membrane.

12. The measurement assembly according to claim 7, wherein at least one of said first position is reached when said moving member is in mechanical abutment with said closure plate and said second position is reached when said moving member is in mechanical abutment with said closure plate.