Integrated circuit embedded with non-volatile one-time-programmable and multiple-time programmable memory
First Claim
Patent Images
1. A two terminal programmable non-volatile device situated on a substrate comprising:
- a floating gate;
wherein said floating gate is comprised of a material that is also used as a gate for a transistor device also situated on the substrate and associated with a logic gate and/or a volatile memory;
a source region coupled to a first terminal; and
a drain region coupled to a second terminal; and
an n-type channel coupling said source region and drain region;
wherein the drain region overlaps a sufficient portion of said gate such that a programming voltage for the device applied to said first terminal of said drain region and second terminal of said source region can be imparted to said floating gate through areal capacitive coupling.
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Abstract
A programmable non-volatile device uses a floating gate that functions as a FET gate that overlaps a portion of a source/drain region. This allows a programming voltage for the device to be imparted to the floating gate through capacitive coupling, thus changing the state of the device. The invention can be used in environments such as data encryption, reference trimming, manufacturing ID, security ID, and many other applications.
25 Citations
41 Claims
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1. A two terminal programmable non-volatile device situated on a substrate comprising:
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a floating gate; wherein said floating gate is comprised of a material that is also used as a gate for a transistor device also situated on the substrate and associated with a logic gate and/or a volatile memory; a source region coupled to a first terminal; and a drain region coupled to a second terminal; and an n-type channel coupling said source region and drain region; wherein the drain region overlaps a sufficient portion of said gate such that a programming voltage for the device applied to said first terminal of said drain region and second terminal of said source region can be imparted to said floating gate through areal capacitive coupling. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 25, 26, 27, 28)
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18. A two terminal programmable device situated on a substrate comprising:
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a floating gate; said floating gate being comprised of a material that includes impurities acting as charge storage sites and is also used as an insulating layer for other non-programmable devices situated on the substrate; a source region coupled to a first terminal; and a drain region coupled to a second terminal; and an n-type channel coupling said source region and drain region; wherein the drain region overlaps a sufficient portion of said gate such that a programming voltage applied to said first terminal of said drain region and second terminal of said source region can be imparted to said floating gate through areal capacitive coupling. - View Dependent Claims (29, 30, 31)
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19. A two terminal one-time programmable (OTP) device situated on a substrate comprising:
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a floating gate; wherein said floating gate is comprised of a material that is also shared by an interconnect and/or another gate for a transistor device also situated on the substrate and associated with a logic gate and/or a volatile memory; a source region coupled to a first terminal; and a drain region coupled to a second terminal and overlapping an areal portion of said floating gate and capacitively coupled thereto; and an n-type channel coupling said source region and drain region; wherein a program voltage can be applied to said first terminal and said second terminal; wherein a threshold of said floating gate can be permanently altered by channel hot electrons caused by said program voltage to store data in the OTP device. - View Dependent Claims (32, 33, 34)
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20. A two terminal one-time programmable (OTP) memory device incorporated on a silicon substrate with one or more other additional logic and/or non-OTP memory devices, characterized in that:
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a. said OTP memory device has an n-type channel; and b. any and all regions and structures of said OTP memory device are derived solely from corresponding regions and structures used as components of the additional logic and/or non-OTP memory devices; and c. said OTP memory device is programmable through a source terminal and a drain terminal using areal capacitive coupling to a floating gate. - View Dependent Claims (35, 36)
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21. A two terminal programmable memory device with a gate, an n-type impurity source coupled to a first terminal and an n-type impurity drain coupled to a second terminal and on a silicon substrate comprising:
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an n-type channel; and wherein the n-type impurity drain overlaps a sufficient portion of said gate such that a programming voltage applied to said second terminal of said n-type impurity drain and said first terminal can be imparted to said gate through areal capacitive coupling; said gate being adapted to function as a floating gate so that the device has a programmed state defined by an amount of charge stored on said gate by said programming voltage; further wherein said charge on said floating gate can be erased so as to permit the device to be re-programmed. - View Dependent Claims (37, 38, 39)
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22. A two terminal one-time programmable (OTP) memory device with a gate, an n-type impurity source coupled to a first terminal and an n-type impurity drain coupled to a second terminal and on a silicon substrate comprising:
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an n-type channel; and wherein the n-type impurity drain overlaps a sufficient portion of said gate such that a voltage applied to said second terminal of n-type impurity drain and said first terminal can be imparted to said gate through areal capacitive coupling; said gate being adapted so that the OTP device has a programmed state defined by a charge state of said gate. - View Dependent Claims (40, 41)
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23. A programmable non-volatile device situated on a substrate comprising:
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a floating gate; wherein said floating gate is comprised of a material that is also used as a gate for a transistor device also situated on the substrate and associated with a logic gate and/or a volatile memory; a source region; and a drain region; and an n-type channel coupling said source region and drain region; wherein the drain region overlaps a sufficient portion of said gate such that a programming voltage for the device applied to said drain can be imparted to said floating gate through capacitive coupling occurring in a first trench situated in the substrate; and a second set of trenches situated in the substrate adapted for use as embedded dynamic random access memory (DRAM).
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24. A programmable non-volatile device situated on a substrate comprising:
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a floating gate associated with a first programmable device; wherein said floating gate is comprised of a material that is also used as a gate for a transistor device also situated on the substrate and associated with a logic gate and/or a volatile memory; a source region; and a drain region; and an n-type channel coupling said source region and drain region; wherein the drain region overlaps a sufficient portion of said gate such that a programming voltage for the device applied to said drain can be imparted to said floating gate through capacitive coupling occurring in a first trench situated in the substrate; and a second programmable device coupled in a paired latch arrangement with the first programmable device such that a datum and its complement are stored in a paired latch.
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Specification