Yield based retargeting for semiconductor design flow
First Claim
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1. A method for modifying an integrated circuit design layout, comprising:
- using a computer system to place a plurality of target points in proximity of a polygon representing a portion of an integrated circuit design;
modifying the target point placement for some or all of the placed target points using a yield function;
fitting a curve to the target points; and
redefining the portion of the integrated circuit as a contour defined by the curve to modify the design layout.
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Abstract
A method for modifying an integrated circuit design layout is presented and can include placing a plurality of target points in the proximity of a polygon representing a portion of the integrated circuit design; modifying the target point placement for some or all of the placed target points; fitting a curve to the target points; and redefining the portion of the integrated circuit as a contour defined by the fitted curve to modify the design layout. In some applications the modified design layout can be used as a target for an optical proximity correction algorithm or for other purposes.
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20 Claims
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1. A method for modifying an integrated circuit design layout, comprising:
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using a computer system to place a plurality of target points in proximity of a polygon representing a portion of an integrated circuit design; modifying the target point placement for some or all of the placed target points using a yield function; fitting a curve to the target points; and redefining the portion of the integrated circuit as a contour defined by the curve to modify the design layout. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A circuit design optimization tool comprising computer executable program code on a computer readable medium configured to cause a processor to perform the functions of:
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placing a plurality of target points in proximity of a polygon representing a portion of an integrated circuit design; modifying the target point placement for some or all of the placed target points using a yield function; fitting a curve to the target points; and redefining the portion of the integrated circuit as a contour defined by the fitted curve to modify the design layout. - View Dependent Claims (12, 13, 14, 15, 16, 17, 18, 19, 20)
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Specification