Ion sources, systems and methods
First Claim
Patent Images
1. A system, comprising:
- a gas field ion source capable of interacting with a gas to generate an ion beam having a brightness of 1×
109 A/cm2sr or more at a surface of a sample.
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Abstract
Ion sources, systems and methods are disclosed.
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Citations
77 Claims
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1. A system, comprising:
a gas field ion source capable of interacting with a gas to generate an ion beam having a brightness of 1×
109 A/cm2sr or more at a surface of a sample.- View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23)
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24. A system, comprising:
a gas field ion source capable of interacting with a gas to generate an ion beam having a reduced brightness of 5×
108A/m2srV or more at a surface of a sample.
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25. A system, comprising:
a gas field ion source capable of interacting with a gas to generate an ion beam having an etendue of 5×
10−
21 cm2sr or less.- View Dependent Claims (26, 27, 28, 29, 30, 31, 32, 33, 34, 35, 36, 37, 38, 39, 40, 41, 42, 43, 44, 45, 46, 47, 48, 49, 50)
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51. A system, comprising:
a gas field ion source capable of interacting with a gas to generate an ion beam having a reduced etendue of 1×
10−
16 cm2srV or less.- View Dependent Claims (52, 53, 54, 55, 56, 57, 58, 59, 60, 61, 62, 63, 64, 65, 66, 67, 68, 69, 70, 71, 72, 73, 74, 75, 76, 77)
Specification