Analog to digital converter with improved input overload recovery

• US 7,786,909 B2
• Filed: 12/18/2008
• Issued: 08/31/2010
• Est. Priority Date: 01/21/2008
• Status: Active Grant

• Current Assignee: Texas Instruments, Inc.
• Original Assignee: Texas Instruments, Inc.
• Inventors: Agarwal, Nitin, Shrivastava, Neeraj, Udupa, Anand Hariraj
• Primary Examiner(s): JEANGLAUDE, JEAN BRUNER
• Application Number:
  US12/337,658
• Publication Number:
  US 20090184853A1
• Time in Patent Office: 621 Days
• Field of Search: 341/118, 341/172, 341/155
• US Class Current: 341/118
• CPC Class Codes: H03M 1/069 by range overlap between successive stages or steps
• CPC Class Codes: H03M 1/129 Means for adapting the input signal to the range the converter can handle, e.g. limiting, pre-scaling H03M1/18 takes precedence; Out-of-range indication
• CPC Class Codes: H03M 1/164 the steps being performed sequentially in series-connected stages H03M1/161 takes precedence

Abstract

With high speed analog to digital converters (ADCs), components within the ADC can enter a saturation region when an input exceeded the input range of the ADC, which can cause errors. Here, a sample of an input signal to an ADC is compared with the upper and lower full-scale levels of the ADC. If input overload is detected, inputs to amplifiers in an input stage of the ADC are forced to zero for the duration of the input overload, and are thus prevented from going into saturation. Input overload conditions are signaled directly to an output digital block of the ADC, which provides output digital codes equivalent to either the upper or the lower full scale level depending on whether the input overload is signaled as exceeding the upper level or the lower level. Input overload recovery time of the ADC may thus be minimized.

Claims

1. An apparatus comprising:

an analog-to-digital converter (ADC) that receives an analog input signal and that outputs a digital signal; and

an overload sense circuit that receives the analog input signal and that is coupled to the ADC, wherein the overload sense circuit inhibits the ADC from sampling the analog input signal for sampling instants where the analog input signal is greater than a first threshold voltage, and wherein the overload sense circuit inhibits the ADC from sampling the analog input signal for sampling instants where the analog input signal is less than a second threshold voltage.

2. The apparatus of claim 1, wherein the overload sense circuit further comprises:

a first comparator that receives the first threshold voltage and that receives the analog input signal, wherein the first comparator indicates when the analog input signal is greater than the first threshold voltage;

a second comparator that receives the second threshold voltage and that receives the analog input signal, wherein the second comparator indicates when the analog input signal is less than the second threshold voltage; and

an OR gate that is coupled to the first and second comparators.

3. The apparatus of claim 1, wherein the overload sense circuit further comprises:

a first comparator that receives the first threshold voltage and that receives the analog input signal, wherein the first comparator indicates when the analog input signal is greater than the first threshold voltage;

a second comparator that receives the second threshold voltage and that receives the analog input signal, wherein the second comparator indicates when the analog input signal is less than the second threshold voltage; and

an OR gate that is coupled to the first and second comparators.

4. The apparatus of claim 3, wherein the ADC further comprises:

a pipeline of ADC stages, wherein the first ADC stage of the pipeline receives the analog input signal, and wherein the first ADC stage of the pipeline is coupled to the OR gate so that the first ADC stage of the pipeline is inhibited from sampling the analog input signal when the analog input signal is greater than the first threshold voltage or less than the second threshold voltage; and

a digital error correction circuit that is coupled to each ADC stage of the pipeline, the first comparator, and the second comparator.

5. The apparatus of claim 3, wherein the ADC further comprises:

a pipeline of ADC stages, wherein the first ADC stage of the pipeline receives the analog input signal, and wherein the first ADC stage of the pipeline is coupled to the OR gate so that the first ADC stage of the pipeline is inhibited from sampling the analog input signal when the analog input signal is greater than the first threshold voltage or less than the second threshold voltage; and

a digital error correction circuit that is coupled to each ADC stage of the pipeline, the first comparator, and the second comparator.

6. The apparatus of claim 5, wherein each ADC stage further comprises:

a flash ADC having an input and an output;

a digital-to-analog converter (DAC) that is coupled to the output of the flash ADC;

a subtractor that is coupled to the DAC and the input of the flash ADC; and

a residue amplifier that is coupled to the subtractor.

7. The apparatus of claim 6, wherein the input circuit further comprises:

a low noise amplifier that is coupled to the transducer array;

a voltage controlled amplifier that is coupled to the low noise amplifier; and

a filter that is coupled between the voltage controlled amplifier and the ADC.

8. The apparatus of claim 5, wherein each ADC stage further comprises:

a flash ADC having an input and an output;

a digital-to-analog converter (DAC) that is coupled to the output of the flash ADC;

a subtractor that is coupled to the DAC and the input of the flash ADC; and

a residue amplifier that is coupled to the subtractor.

9. An apparatus comprising:

a processor;

a transducer array;

a beam forming circuit that is coupled to the processor;

a transmit circuit that is coupled between the beam forming circuit and the transducer array; and

a receive circuit having a plurality of processing pipelines, wherein each pipeline includes;

an input circuit that is coupled to the transducer array;

an ADC that is coupled to the input circuit and the beam forming circuit, wherein the ADC receives an analog input signal from the input circuit; and

an overload sense circuit that is coupled to the ADC and the input circuit, wherein the overload sense circuit inhibits the ADC from sampling the analog input signal for sampling instants where the analog input signal is greater than a first threshold voltage, and wherein the overload sense circuit inhibits the ADC from sampling the analog input signal for sampling instants where the analog input signal is less than a second threshold voltage.