Configurable voltage regulator
First Claim
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1. A configurable semiconductor, comprising:
- N terminals adapted to be connected to at least one of T external impedances, where N is an integer greater than zero and T is an integer greater than one,wherein said T external impedances have impedance values within predetermined tolerances;
a measurement circuit that measures an impedance value of said at least one of said T external impedances; and
a control circuit that compares said measured impedance value to T ranges and that selects a value of a device characteristic based on said comparison,wherein said value of said device characteristic selected by said control circuit is independent of said predetermined tolerances of said T external impedances.
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Abstract
A configurable semiconductor has a device characteristic that is controllable as a function of at least one external impedance. A measurement circuit measures an electrical characteristic of the at least one external impedance and determines a select value corresponding to the measured electrical characteristic. A first circuit controls the device characteristic as a function of the select value.
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Citations
29 Claims
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1. A configurable semiconductor, comprising:
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N terminals adapted to be connected to at least one of T external impedances, where N is an integer greater than zero and T is an integer greater than one, wherein said T external impedances have impedance values within predetermined tolerances; a measurement circuit that measures an impedance value of said at least one of said T external impedances; and a control circuit that compares said measured impedance value to T ranges and that selects a value of a device characteristic based on said comparison, wherein said value of said device characteristic selected by said control circuit is independent of said predetermined tolerances of said T external impedances. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15)
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16. A method for configuring a semiconductor, comprising:
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adapting N terminals of a semiconductor to be connected to at least one of T external impedances, where N is an integer greater than zero and T is an integer greater than one, wherein said T external impedances have impedance values within predetermined tolerances; measuring an impedance value of said at least one of said T external impedances; comparing said measured impedance value to T ranges; and selecting a value of a device characteristic based on said comparison, wherein said value of said device characteristic selected by said control circuit is independent of said predetermined tolerances of said T external impedances. - View Dependent Claims (17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29)
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Specification