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System and method for repairing a memory

  • US 7,788,551 B2
  • Filed: 08/08/2008
  • Issued: 08/31/2010
  • Est. Priority Date: 11/05/2003
  • Status: Active Grant
First Claim
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1. A memory instance having a plurality (N) of main array column (MAC) portions and a redundancy array column (RAC) portion, wherein each of said MAC portions and said RAC portion is associated with a sense amplifier and write driver (SAWD) circuit block for operably coupling with one of N input/output (I/O) blocks provided for said memory instance, said memory instance comprising:

  • means for detecting that one of said MAC portions is faulty;

    means for decoupling said faulty MAC portion'"'"'s SAWD circuit block from an I/O block associated therewith and for shifting said faulty MAC portion'"'"'s I/O block to a SAWD circuit block associated with a MAC portion adjacent to said faulty MAC portion on a selected side thereof; and

    means for successively shifting coupling relationships between SAWD circuit blocks and I/O blocks for each MAC portion disposed on said selected side of said faulty MAC portion until an I/O block associated with a MAC portion that is adjacent to said RAC portion is shifted to said RAC portion'"'"'s SAWD circuit block.

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