Mass production testing of USB flash cards with various flash memory cells
First Claim
1. A method for formatting/testing universal serial bus (USB) devices using a test host by standard commands of a bulk-only-transport (BOT) protocol from a computing system, the method comprising:
- coupling a plurality of USB devices to the test host, each USB device including a flash controller and one or more flash memory devices, wherein each USB device includes an extended USB connector plug attached to a printed circuit board (PCB) assembly (PCBA) or a chip-on-board (COB) having the one or more flash memory devices and the flash controller attached, wherein the extended USB connector plug includesa plurality of plug standard metal contact pins disposed on the pin substrate, wherein when the standard pin substrate of the extended USB connector plug is inserted into a cavity of the standard USB socket, the standard metal contact pins make physical and electrical contact with plug standard metal contact pins on a plug pin substrate, anda plurality of plug extended metal contact pins on the extended pin substrate, wherein when the extended pin substrate of the extended USB connector plug is inserted into a cavity of the extended USB socket, the plug extended metal contact pins on the extended pin substrate make physical and electrical contact with socket extended metal contact pins on the extended USB socket,reading at least one controller endpoint descriptor value from each of the plurality of USB devices based on a BOT protocol read command, and verifying that the controller endpoint descriptor values of each of the plurality of USB devices matches stored descriptor values stored in the test host through the BOT protocol read command;
performing one of testing and formatting operations on each of the USB devices having a valid endpoint descriptor value by writing predetermined data into the flash memory devices according to a BOT protocol write command in a pipelined manner, and then reading the predetermined data from the flash memory devices and comparing the read predetermined data with known good data stored in the test host according to the BOT protocol; and
erasing content of one or more memory cells from the flash memory devices according to the BOT protocol write command using arbitration logic and predetermined data that is stored in the flash memory devices.
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Accused Products
Abstract
A high volume testing/formatting process is provided for Universal Serial Bus-based (USB-based) electronic data flash cards (USB devices) that meets the increasing demand for USB electronic data flash cards (USB devices). A test host is simultaneously coupled to the multiple USB devices (e.g., using a multi-port card reader or a probe fixture), a controller endpoint value is read from each of the USB devices and verified with a known good value, and then testing/formatting is performed on each of the USB devices by writing predetermined data into each USB device in a pipelined manner, then reading out and testing the predetermined data. In one embodiment, the test host implements a special USB driver that blocks standard USB registration procedures upon detecting the plurality of USB devices. Control and/or boot code data are written onto the flash memory device (i.e., instead of being provided on a controller ROM).
81 Citations
19 Claims
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1. A method for formatting/testing universal serial bus (USB) devices using a test host by standard commands of a bulk-only-transport (BOT) protocol from a computing system, the method comprising:
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coupling a plurality of USB devices to the test host, each USB device including a flash controller and one or more flash memory devices, wherein each USB device includes an extended USB connector plug attached to a printed circuit board (PCB) assembly (PCBA) or a chip-on-board (COB) having the one or more flash memory devices and the flash controller attached, wherein the extended USB connector plug includes a plurality of plug standard metal contact pins disposed on the pin substrate, wherein when the standard pin substrate of the extended USB connector plug is inserted into a cavity of the standard USB socket, the standard metal contact pins make physical and electrical contact with plug standard metal contact pins on a plug pin substrate, and a plurality of plug extended metal contact pins on the extended pin substrate, wherein when the extended pin substrate of the extended USB connector plug is inserted into a cavity of the extended USB socket, the plug extended metal contact pins on the extended pin substrate make physical and electrical contact with socket extended metal contact pins on the extended USB socket, reading at least one controller endpoint descriptor value from each of the plurality of USB devices based on a BOT protocol read command, and verifying that the controller endpoint descriptor values of each of the plurality of USB devices matches stored descriptor values stored in the test host through the BOT protocol read command; performing one of testing and formatting operations on each of the USB devices having a valid endpoint descriptor value by writing predetermined data into the flash memory devices according to a BOT protocol write command in a pipelined manner, and then reading the predetermined data from the flash memory devices and comparing the read predetermined data with known good data stored in the test host according to the BOT protocol; and erasing content of one or more memory cells from the flash memory devices according to the BOT protocol write command using arbitration logic and predetermined data that is stored in the flash memory devices. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16)
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17. A method for formatting/testing universal serial bus (USB) device using a test host by standard commands of a bulk-only-transport (BOT) protocol from a computing system, the method comprising:
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coupling the USB device to the test host, the USB device including a flash controller and one or more flash memory devices, wherein the USB device includes an extended USB connector plug attached to a printed circuit board (PCB) assembly (PCBA) or a chip-on-board (COB) having the one or more flash memory devices and the flash controller attached, wherein the extended USB connector plug includes a plug extended metal contact pins on the extended pin substrate, wherein when the extended pin substrate of the extended USB connector plug is inserted into a cavity of the extended USB socket, the plug extended metal contact pins on the extended pin substrate make physical and electrical contact with socket extended metal contact pins on the extended USB socket, reading at least one controller endpoint descriptor value from the USB device based on a BOT protocol read command, and verifying that the controller endpoint descriptor values of the USB device matches stored descriptor values stored in the test host through Bulk Only Transport protocol; performing one of testing and formatting operations on the USB device having a valid endpoint descriptor value by writing predetermined data into the flash memory devices according to a BOT protocol write command in a pipelined manner, and then reading the predetermined data from the flash memory devices and comparing the read predetermined data with known good data stored in the test host also according to the BOT protocol read command; and erasing contents of one or more memory cells from flash memory devices according to the BOT protocol write command using arbitration logic and predetermined data that is stored in the flash memory devices, wherein the USB device comprises SLC or MLC flash memory cells, and wherein the SLC type memory cells include at least one of SSLC (Small Block SLC), LSLC (Large Block SLC) or a combination thereof, and wherein the MLC type memory cells include SMLC (Small Block MLC) and LSLC (Large Block MLC). - View Dependent Claims (18, 19)
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Specification