Photomask with detector for optimizing an integrated circuit production process and method of manufacturing an integrated circuit using the same
First Claim
1. A photomask for integrated circuit production comprising:
- a substrate;
one or more layers;
a detector for monitoring a process parameter of the integrated circuit production; and
communication circuitry for communicating with external equipment for the integrated circuit production.
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Abstract
A photomask for integrated circuit production comprising a substrate, one or more layers and a detector for monitoring a process parameter of the integrated circuit production in combination with one or more of the following: communication circuitry for communicating with external equipment for the integrated circuit production, a computational processor for analyzing the monitored process parameter, and a data storage component. In addition, a method of integrated circuit production comprising the steps of providing a photomask in the integrated circuit production process and monitoring a process parameter of the integrated circuit production using the photomask, in combination with one or more following steps: analyzing the monitored process parameter using the photomask; communicating the monitored process parameter from the photomask to external equipment involved in the integrated circuit production; and storing the monitored process parameter in the photomask. For example, the photomask embodying aspects of the present invention may monitor and track the process parameter of a stepper during the integrated circuit production. The monitored data may be analyzed against the production information to determine possible adjustment or alteration to the integrated circuit production steps.
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Citations
61 Claims
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1. A photomask for integrated circuit production comprising:
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a substrate; one or more layers; a detector for monitoring a process parameter of the integrated circuit production; and communication circuitry for communicating with external equipment for the integrated circuit production. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 35, 36, 37, 38, 39, 40, 41, 42, 43, 44, 45, 46, 47, 48, 49, 50, 51, 52, 53, 54, 55, 56, 57, 58, 59, 60, 61)
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Specification