Strained tri-channel layer for semiconductor-based electronic devices
First Claim
1. A semiconductor-based structure, comprising:
- a first tensilely strained layer consisting essentially of silicon;
a second tensilely strained layer consisting essentially of silicon;
a compressively strained layer forming a p-channel, and consisting essentially of silicon and germanium disposed between and in contact with the first and second tensilely strained layers, the first and second tensilely strained layers impeding diffusion of germanium out of the compressively strained layer;
a substrate in contact with the first tensilely strained layer that induces tensile strain into the first tensilely strained layer;
a gate disposed over the second tensilely strained layer to establish the p-channel;
a source region at a first side of the p-channel; and
a drain region at a second side of the p-channel.
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Accused Products
Abstract
A semiconductor-based structure includes a substrate layer, a compressively strained semiconductor layer adjacent to the substrate layer to provide a channel for a component, and a tensilely strained semiconductor layer disposed between the substrate layer and the compressively strained semiconductor layer. A method for making an electronic device includes providing, on a strain-inducing substrate, a first tensilely strained layer, forming a compressively strained layer on the first tensilely strained layer, and forming a second tensilely strained layer on the compressively strained layer. The first and second tensilely strained layers can be formed of silicon, and the compressively strained layer can be formed of silicon and germanium.
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Citations
22 Claims
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1. A semiconductor-based structure, comprising:
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a first tensilely strained layer consisting essentially of silicon; a second tensilely strained layer consisting essentially of silicon; a compressively strained layer forming a p-channel, and consisting essentially of silicon and germanium disposed between and in contact with the first and second tensilely strained layers, the first and second tensilely strained layers impeding diffusion of germanium out of the compressively strained layer; a substrate in contact with the first tensilely strained layer that induces tensile strain into the first tensilely strained layer; a gate disposed over the second tensilely strained layer to establish the p-channel; a source region at a first side of the p-channel; and a drain region at a second side of the p-channel. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14)
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15. A semiconductor-based structure, comprising:
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a substrate; a compressively strained semiconductor layer adjacent to the substrate to provide a channel of a semiconductor component; a tensilely strained semiconductor layer disposed between the substrate and the compressively strained semiconductor layer, and in contact with the compressively-strained semiconductor layer, the tensilely strained semiconductor layer impeding diffusion of a species out of the compressively strained semiconductor layer; a gate disposed over the compressively strained layer to establish the channel; a source region at a first side of the channel; a drain region at a second side of the channel; and a second tensilely strained layer consisting essentially of a semiconductor in contact with the compressively strained layer on an opposite side of the compressively strained layer relative to the tensilely strained layer; wherein the substrate induces tensile strain into the tensilely strained semiconductor layer. - View Dependent Claims (16, 17, 18, 19)
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20. A method for making an electronic device, comprising:
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providing, on a substrate, a first tensilely strained layer consisting essentially of silicon, wherein the substrate induces tensile strain into the first tensilely strained layer; forming a compressively strained layer on the first tensilely strained layer, the compressively strained layer consisting essentially of silicon and germanium; forming a second tensilely strained layer on the compressively strained layer, the second tensilely strained layer consisting essentially of silicon; forming a gate over the second tensilely strained layer; forming a source region at a first side of the compressively strained layer; and forming a drain region at a second side of the compressively strained layer. - View Dependent Claims (21, 22)
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Specification