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Methods of examining an item of luggage by means of an x-ray diffraction method

  • US 7,792,248 B2
  • Filed: 06/28/2005
  • Issued: 09/07/2010
  • Est. Priority Date: 06/28/2004
  • Status: Expired due to Fees
First Claim
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1. Method of examining an item of luggage comprising:

  • obtaining a first X-ray fluoroscopic image of the whole item of luggage;

    identifying one or more planiform suspect regions in the first X-ray fluoroscopic image;

    calculating a travel path for an X-ray beam; and

    moving the X-ray beam along the travel path to obtain an X-ray diffraction scan of the item of luggage, wherein a scanning speed at which the X-ray beam moves depends on whether the X-ray beam is located in the one or more planiform suspect regions, wherein the scanning speed is faster outside the one or more planiform suspect regions than inside the one or more suspect regions, and is slow enough inside the one or more planiform suspect regions to obtain an informative X-ray diffraction image.

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