Methods of examining an item of luggage by means of an x-ray diffraction method
First Claim
Patent Images
1. Method of examining an item of luggage comprising:
- obtaining a first X-ray fluoroscopic image of the whole item of luggage;
identifying one or more planiform suspect regions in the first X-ray fluoroscopic image;
calculating a travel path for an X-ray beam; and
moving the X-ray beam along the travel path to obtain an X-ray diffraction scan of the item of luggage, wherein a scanning speed at which the X-ray beam moves depends on whether the X-ray beam is located in the one or more planiform suspect regions, wherein the scanning speed is faster outside the one or more planiform suspect regions than inside the one or more suspect regions, and is slow enough inside the one or more planiform suspect regions to obtain an informative X-ray diffraction image.
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Abstract
The invention relates to a method of examining an item of luggage 1, in which an X-ray fluoroscopic image of the whole item of luggage 1 is produced first, then planiform suspect regions 4, 5, 6 in the X-ray fluoroscopic image are determined and the scanning time during the following production of an X-ray diffraction image depends on whether the X-ray beam is located specifically in a planiform suspect region 4, 5, 6, wherein the scanning time heads towards zero outside a planiform suspect region 4, 5, 6 and lasts long enough inside a planiform suspect region 4, 5, 6 to obtain an informative X-ray diffraction image.
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14 Claims
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1. Method of examining an item of luggage comprising:
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obtaining a first X-ray fluoroscopic image of the whole item of luggage; identifying one or more planiform suspect regions in the first X-ray fluoroscopic image; calculating a travel path for an X-ray beam; and moving the X-ray beam along the travel path to obtain an X-ray diffraction scan of the item of luggage, wherein a scanning speed at which the X-ray beam moves depends on whether the X-ray beam is located in the one or more planiform suspect regions, wherein the scanning speed is faster outside the one or more planiform suspect regions than inside the one or more suspect regions, and is slow enough inside the one or more planiform suspect regions to obtain an informative X-ray diffraction image. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14)
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Specification