Etching technique for the fabrication of thin (Al, In, Ga)N layers
First Claim
1. A method of etching thin epitaxially-grown nitride layers, comprising:
- (a) selecting a suitable template or substrate;
(b) implanting the template or substrate with foreign ions over a desired area to create ion implanted material;
(c) performing a regrowth of a nitride device structure on the implanted template or substrate;
(d) bonding an exposed growth surface of the nitride device structure to a carrier wafer, so that the nitride device structure is positioned between the carrier wafer and the implanted template or substrate, to create a bonded nitride device structure/carrier wafer structure; and
(e) exposing the ion implanted material on the bonded nitride device structure/carrier wafer structure to a suitable etchant for a sufficient time to remove the ion implanted material from a surface of the implanted template or substrate opposite the nitride device structure, so that the surface of the implanted template or substrate is planar on a nanometer scale.
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Accused Products
Abstract
An etching technique for the fabrication of thin (Al, In, Ga)N layers. A suitable template or substrate is selected and implanted with foreign ions over a desired area to create ion implanted material. A regrowth of a device structure is then performed on the implanted template or substrate. The top growth surface of the template is bonded to a carrier wafer to created a bonded template/carrier wafer structure. The substrate is removed, as is any residual material, to expose the ion implanted material. The ion implanted material on the bonded template/carrier wafer structure is then exposed to a suitable etchant for a sufficient time to remove the ion implanted material.
7 Citations
14 Claims
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1. A method of etching thin epitaxially-grown nitride layers, comprising:
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(a) selecting a suitable template or substrate; (b) implanting the template or substrate with foreign ions over a desired area to create ion implanted material; (c) performing a regrowth of a nitride device structure on the implanted template or substrate; (d) bonding an exposed growth surface of the nitride device structure to a carrier wafer, so that the nitride device structure is positioned between the carrier wafer and the implanted template or substrate, to create a bonded nitride device structure/carrier wafer structure; and (e) exposing the ion implanted material on the bonded nitride device structure/carrier wafer structure to a suitable etchant for a sufficient time to remove the ion implanted material from a surface of the implanted template or substrate opposite the nitride device structure, so that the surface of the implanted template or substrate is planar on a nanometer scale. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14)
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Specification