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Shape measurement device probe and shape measurement device

  • US 7,797,851 B2
  • Filed: 05/08/2007
  • Issued: 09/21/2010
  • Est. Priority Date: 05/18/2006
  • Status: Active Grant
First Claim
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1. A shape measurement device probe comprising:

  • a measuring surface contacting unit including an arm and a stylus, the stylus being arranged at a distal end of the arm and contacting a surface to be measured of a measuring object;

    an attachment member for attaching the measuring surface contacting unit to the shape measurement device;

    a connecting mechanism including a supporting point member arranged in the measuring surface contacting unit and a mounting platform fixed to the attachment member and to be mounted with the supporting point member, for connecting the measuring surface contacting unit and the attachment member in a swinging manner with the supporting point member as a supporting point; and

    a biasing mechanism including a movable side member arranged on the measuring surface contacting unit and a fixed side member arranged on the attachment member, the movable side member and the fixed side member being arranged to face each other in a vertical direction and configured to generate magnetic attraction force in a non-contacting state, the biasing mechanism biasing the measuring surface contacting unit such that the arm is directed in the vertical direction by the magnetic attraction force.

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