Method and apparatus for accurate calibration of VUV reflectometer
First Claim
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1. A method of calibrating a system that obtains reflectance data, comprising:
- collecting reflectance data from a standard sample, wherein exact properties of the standard sample vary from assumed properties of the standard sample; and
utilizing, in the wavelength region for which calibration is desired, the presence of reflectance variations from the standard sample that result from variations between actual and assumed properties of the standard sample to assist in calibrating the system,wherein the utilizing step further comprises utilizing a ratio of an assumed reflectance spectrum of the standard sample and an actual reflectance spectrum of the standard sample.
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Abstract
A calibration technique is provided that utilizes a standard sample that allows for calibration in the wavelengths of interest even when the standard sample may exhibit significant reflectance variations at those wavelengths for subtle variations in the properties of the standard sample. A second sample, a reference sample may have a relatively featureless reflectance spectrum over the same spectral region and is used in combination with the calibration sample to achieve the calibration. In one embodiment the spectral region may include the VUV spectral region.
99 Citations
30 Claims
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1. A method of calibrating a system that obtains reflectance data, comprising:
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collecting reflectance data from a standard sample, wherein exact properties of the standard sample vary from assumed properties of the standard sample; and utilizing, in the wavelength region for which calibration is desired, the presence of reflectance variations from the standard sample that result from variations between actual and assumed properties of the standard sample to assist in calibrating the system, wherein the utilizing step further comprises utilizing a ratio of an assumed reflectance spectrum of the standard sample and an actual reflectance spectrum of the standard sample. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A method of calibrating a reflectometer, comprising:
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assuming the presence of a calibration error function in a standard sample; calibrating the reflectometer by utilizing the calibration error function of the standard sample; and determining the reflectance of a reference sample, wherein the reference sample has a reflectance spectrum that has less features, in the wavelengths of at least the calibration, than the standard sample, and wherein physical changes in the standard sample create changes in a reflected signal of the standard sample and a calibration error function contribution, and wherein the reflectometer is first calibrated utilizing assumed properties of the standard sample, the reflectance spectrum of the reference sample is obtained and processed utilizing the first calibration, the actual properties of the standard sample are determined utilizing the reflectance spectrum of the reference sample, and then the reflectometer is re-calibrated utilizing the determined actual properties of the standard sample. - View Dependent Claims (9, 10, 11, 12, 13, 14, 15, 16, 17, 18)
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19. A method for providing a calibration routine for calibrating a reflectometer, comprising:
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configuring the calibration routine to utilize a standard sample, calibration being desired in at least a portion of a first wavelength region; configuring the calibration routine to utilize a first set of reflectance data from the standard sample and to provide a first calibration of the reflectometer based at least in part upon the first set of reflectance data; configuring the calibration routine to utilize a reference sample that spectrally has less features in at least the first wavelength region, than the standard sample; configuring the calibration routine to utilize a second set of reflectance data from the reference sample; and configuring the calibration routine to utilize the first and second set of reflectance data to further calibrate the reflectometer, wherein the calibration routine utilizes a calibration error function, and wherein the calibration error function is indicative of a ratio of an assumed reflectance spectrum of the standard sample and an actual reflectance spectrum of the standard sample. - View Dependent Claims (20, 21, 22, 23, 24, 25)
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26. A method of calibrating a reflectometer, comprising:
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collecting a first set of reflectance data from a standard sample that has a calibration error function in a first wavelength region in which calibration is desired, wherein the first wavelength region comprises at least a portion of the VUV wavelength region, and wherein the calibration error function represents an error that exceeds 0.2% for at least some wavelengths in the VUV region; collecting a second set of reflectance data from a reference sample that has less spectral features as compared to the standard sample in the first wavelength region; utilizing the first and second sets of reflectance data to calibrate the reflectometer; performing a first calibration of the reflectometer by utilizing assumed properties of the standard sample and measured reflectance data of the standard sample; obtaining a reflectance spectrum of the reference sample utilizing reflectometer measurements from the reference sample and data from the first calibration; utilizing the obtained reflectance spectrum of the reference sample to determine actual properties of the standard sample; and re-calibrating the reflectometer utilizing the determined actual properties of the standard sample. - View Dependent Claims (27, 28, 29, 30)
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Specification