Method and apparatus for selectively compacting test responses

• US 7,805,649 B2
• Filed: 03/02/2009
• Issued: 09/28/2010
• Est. Priority Date: 11/23/1999
• Status: Expired due to Fees

• Current Assignee: Siemens Industry Software Limited (Siemens AG)
• Original Assignee: Mentor Graphics Corporation (Siemens AG)
• Inventors: Mukherjee, Nilanjan, Tyszer, Jerzy, Rajski, Janusz, Kassab, Mark
• Primary Examiner(s): BRITT, CYNTHIA H
• Application Number:
  US12/396,377
• Publication Number:
  US 20090228749A1
• Time in Patent Office: 575 Days
• Field of Search: 714/729, 714/732
• US Class Current: 714/732
• CPC Class Codes: G01R 31/318547 Data generators or compressors

Abstract

A method and apparatus to compact test responses containing unknown values or multiple fault effects in a deterministic test environment. The proposed selective compactor employs a linear compactor with selection circuitry for selectively passing test responses to the compactor. In one embodiment, gating logic is controlled by a control register, a decoder, and flag registers. This circuitry, in conjunction with any conventional parallel test-response compaction scheme, allows control circuitry to selectively enable serial outputs of desired scan chains to be fed into a parallel compactor at a particular clock rate. A first flag register determines whether all, or only some, scan chain outputs are enabled and fed through the compactor. A second flag register determines if the scan chain selected by the selector register is enabled and all other scan chains are disabled, or the selected scan chain is disabled and all other scan chains are enabled. Other embodiments allow selective masking of a variable number of scan chain outputs.

Claims

1. An apparatus used in testing of an integrated circuit, comprising:

a compactor formed from a feedback-free network of XOR or XNOR gates, the compactor having compactor inputs and compactor outputs, the number of compactor outputs being less than the number of compactor inputs, the compactor being configured to compress test responses from a circuit under test; and

a selector circuit coupled to the compactor inputs, the selector circuit comprising logic controlled by one or more control lines, the logic being configured to either allow test response values output from one or more scan chain outputs to be input to the compactor inputs or to mask the test response values output from the one or more scan chain outputs, the test response values being responsive to deterministic test patterns applied to the integrated circuit.

2. The apparatus of claim 1, wherein the selector circuit includes a register coupled to one or more AND gates.

3. The apparatus of claim 1, wherein the selector circuit includes a register that stores a flag that when activated allows all the test response values to pass to the compactor and that when deactivated allows none of the test response values to pass to the compactor.

4. The apparatus of claim 1 wherein the compactor and selector circuit are physically located on the integrated circuit.

5. The apparatus of claim 1 wherein the compactor and selector circuit are physically located externally of the integrated circuit.

6. The apparatus of claim 1, further including automatic testing equipment (ATE) coupled to the integrated circuit, the ATE being external to the integrated circuit and controlling the selector circuit.

7. The apparatus of claim 1, wherein the compactor includes only linear logic gates.

8. The apparatus of claim 1, wherein the logic is configured to selectively mask the test response values on a clock-cycle-by-clock-cycle basis.

9. The apparatus of claim 1, wherein the compactor is a first compactor, the apparatus further comprising a second compactor.

10. The apparatus of claim 9, wherein the selector circuit is a first selector circuit, the apparatus further comprising a second selector circuit coupled to the second compactor.

11. The apparatus of claim 10, wherein the first selector circuit and the second selector circuit are controllable independently of each other.

12. The apparatus of claim 1, wherein the selector circuit includes a control register for storing control bits that identify which of the one or more scan chain outputs are to be masked.

13. The apparatus of claim 1, wherein the control lines are configured to connect to external automatic test equipment.

14. A method for selectively compacting test responses to deterministic test patterns of an integrated circuit, comprising:

receiving test response values output from scan chains in an integrated circuit, the test response values being responsive to deterministic test patterns applied to the integrated circuit;

selectively masking one or more of the test response values from being passed to one or more spatial compactors, the one or more masked test response values including one or more unknown test response values or one or more test response values showing a fault effect; and

compacting the test response values passed to the one or more spatial compactors.

15. The method of claim 14, wherein the compacting the test response values passed to the one or more spatial compactors includes logically combining the test response values using linear logic gates.

16. The method of claim 15, wherein the linear logic gates are XNOR or XOR gates.

17. The method of claim 14, wherein the selectively masking includes masking all test response values to a test pattern output from a scan chain.

18. The method of claim 14, wherein the selectively masking includes masking the one or more test response values on a clock-cycle-by-clock-cycle basis.

19. The method of claim 14, wherein the selectively masking is controlled by control data on one or more control lines.

20. The method of claim 14, further comprising comparing the compacted test response values to a fault-free response to determine if there is a match.

21. The method of claim 14, wherein the selectively compacting is performed using control logic and a control register, the control register being configured to load control data that identifies which of the test response values to mask.