Line tracing method and apparatus utilizing non-linear junction detecting locator probe

• US 7,808,226 B1
• Filed: 10/26/2005
• Issued: 10/05/2010
• Est. Priority Date: 10/26/2005
• Status: Expired due to Fees

• Current Assignee: Research Electronics International LLC (Heico Corporation)
• Original Assignee: Research Electronics International LLC (Heico Corporation)
• Inventors: Kelly, Sean M., Jones, Thomas H., Barsumian, Bruce R.
• Primary Examiner(s): Aurora; Reena
• Application Number:
  US11/258,944
• Time in Patent Office: 1,805 Days
• Field of Search: 324/67, 324/326, 324/533, 324/534, 324/535, 342/193, 340/572.2, 340/551, 340/572.1, 340/572.4, 340/572.7
• US Class Current: 324/67
• CPC Class Codes: G01V 3/06 using ac

Abstract

A method, device, and apparatus for tracing a conductive line and locating any concealed surveillance devices coupled to the line uses a signal generator to produce a test signal having a fundamental frequency which is coupled to the line under test. The test signal flowing through the line under test creates electromagnetic waves that propagate through the atmosphere away from the line. A portable locator probe is used to detect the radiated signal and thus the conductive line by detecting the magnitude of the radiated signal. As the locator probe is moved closer to the line, the amplitude of the detected signal increases. In addition, the portable locator probe detects harmonic signals radiated from nonlinear junctions coupled to the line at harmonic frequencies of the fundamental test signal. By examining the relative strengths of the second and third harmonic signals, a user can determine if the detected non-linear junction is being produced by a semiconductor or a corrosive/dissimilar metal type non-linear junction. A DC bias voltage can be used to improve the responses of any semiconductor based non-linear junctions. Any semiconductor junctions located with the probe are manually examined to determine the cause of the non-linear junction.

Claims

1. A method of tracing a conductive line and identifying electronic devices electrically connected to said line, said method comprising:

generating a detection signal having a first fundamental frequency;

coupling said detection signal to said conductive line;

tracking said conductive line by remotely tracing the signal strength of said detection signal radiating from said conductive line; and

locating said electronic devices electronically connected to said conductive line by remotely detecting harmonic signals produced by said electronic devices at a second harmonic frequency of said detection signal in response to said electronic devices being exposed to said detection signal.

2. The method of claim 1 wherein the step of locating said electronic devices further comprises remotely detecting a signal strength at a second and third harmonic frequency of said fundamental frequency and comparing a signal strength of said signal at said second harmonic frequency to a signal strength at said third harmonic frequency to identify a corrosive/dissimilar metal type non-linear junction.

3. The method of claim 1 wherein generating a detection signal comprises generating a first detection signal having a first fundamental frequency and generating a second detection signal having a second fundamental frequency equal to approximately one half of said first detection signal such that a second harmonic frequency of said second detection signal is approximately equal to said first fundamental frequency of said first detection signal.

4. The method of claim 1 wherein a DC bias voltage circuit is added to a conductive line for the purpose of enhancing a harmonic non-linear junction response to the detection signal.

5. The method of claim 4 wherein the DC bias voltage is varied in value to and/or polarity for the purpose of enhancing the harmonic non-linear junction response to the detection signal and improving the ability to discriminate between semiconductor based non-linear junctions and corrosive/dissimilar metal type non-linear junctions.

6. The method of claim 1 further comprising displaying a detected relative signal strength of said detection signal at said first fundamental frequency and displaying a relative detected signal strength of at least one harmonic signal being radiated by a non-linear junction.

7. The method of claim 1 wherein said detection signals are coupled to the line at a first fundamental frequency and then at least one second sub-harmonic frequency.

8. The method of claim 1 wherein the step of locating the conductive line further comprises using a portable locator probe to detect said conductive line by detecting a signal strength of said detection signal radiating from said conductive line.

9. The method of claim 1 further comprising using a near field antenna such that the antenna has a null affect when the antenna field is orthogonal to the detecting signal to track said conductive line and locate said non-linear junctions.

10. A device for tracing a transmission line and locating any non-linear junctions coupled to said transmission line that may be indicative of a concealed surveillance device, said device comprising:

a signal generating and transmitting device for generating a first signal having a fundamental frequency and coupling said signal to said transmission line wherein said signal generator includes DC bias voltage circuitry for generating a DC bias voltage which is connected to the conducting line to enhance the response of said non-linear junctions coupled to said transmission line; and

a portable locator probe having an antenna for remotely detecting a relative strength of said first signal at said first fundamental frequency radiating, from said transmission line and detecting a relative signal strength of at least one harmonic frequency signal radiating from a non-linear junction coupled to said transmission line.

11. The device of claim 10 wherein said portable locator probe detects relative signal strengths of signals at second and third harmonic frequencies of said first signal.

12. The device of claim 11 further comprising processing logic for predicting whether or not a semiconductor non-linear junction has been detected based upon said detected signal strengths of said second and third harmonic frequency signals.

13. The device of claim 10 wherein said signal generating and transmitting device further generates a second signal having a frequency approximately equal to one half of said fundamental frequency and a third signal having a frequency approximately equal to one third of said fundamental frequency.

14. The device of claim 10 wherein the DC bias voltage is changed in value or in polarity.

15. The device of claim 10 wherein said portable locator includes a display for displaying signal strength information of said first signal and said at least one harmonic frequency signal.

16. The device of claim 10 wherein said antenna is a near field antenna designed to create a null affect over the peak of the detected line.

17. An apparatus for determining a location of an at least partially concealed conductive line and detecting the presence of non-linear junctions coupled to said electrically conductive line, said apparatus comprising:

a signal generator for generating a test signal haying at least one fundamental frequency component and coupling said test signal to said electrically conductive line; and

a locator probe for detecting, said conductive line by detecting signals radiated from said conductive line at said fundamental frequency and detecting, said non-linear junctions by detecting signals radiating from said non-linear junctions;

wherein said signal generator alters the frequency of said test signal such that a single frequency receiver in said locator probe can be utilized to detect both said electrically conductive line and said non-linear junction harmonic signals.

18. The apparatus of claim 17 wherein DC bias voltage circuitry is connected to the conducting line to enhance a response of the non-linear junctions to the test signal.

19. The apparatus of claim 17 wherein said signal generator produces sub harmonic detection signals of a first fundamental signal such that said single frequency receiver tuned to said fundamental frequency can also be utilized to detect second and third harmonics radiated by non-linear junctions.

20. The apparatus of claim 17 wherein said locator probe detects said non-linear junctions by detecting at least one of a second and third harmonic of said test signal.

21. The apparatus of claim 17 wherein said locator probe further comprises a display for displaying detection information concerning said test signal and at least one of said second and third harmonic signals.

22. The apparatus of claim 17 further comprising a near field antenna designed to create a null over the detected line.

23. A method of tracing a concealed conductive line and identifying electronic devices coupled to said line, said method comprising:

generating a detection signal having a first fundamental frequency;

coupling said detection signal to said concealed conductive line;

tracking said concealed conductive line by remotely tracing the signal strength of said detection signal radiating from said conductive line; and

locating electronic devices coupled to said conductive line by remotely detecting harmonic signals radiated front said electronic devices at harmonic frequencies of said detection signal in response to said detection signal.

24. The method of claim 23 wherein said concealed conductive line is a digital communication line.

25. The method of claim 24 further comprising the step of electrically coupling a DC bias voltage to said digital communication line.

26. The method of claim 23 further comprising the step of comparing a signal strength of a second and a third harmonic signal to distinguish said electronic devices from metallic junctions.