Devices and methods for automatically verifying, calibrating and surveying instruments for computer-assisted surgery

• US 7,809,184 B2
• Filed: 05/04/2006
• Issued: 10/05/2010
• Est. Priority Date: 05/04/2005
• Status: Active Grant

• Current Assignee: Brainlab AG
• Original Assignee: Brainlab AG
• Inventors: Neubauer, Timo, Plassky, Norman
• Primary Examiner(s): Chawan; Sheela C
• Application Number:
  US11/381,584
• Publication Number:
  US 20060264742A1
• Time in Patent Office: 1,615 Days
• Field of Search: 382/154, 382/313, 382/128, 600/426, 600/424, 600/707, 600/429, 606/130, 340/990, 340/961, 342/29
• US Class Current: 382/154
• CPC Class Codes: A61B 2017/00725 Calibration or performance testing
• CPC Class Codes: A61B 2034/102 Modelling of surgical devices, implants or prosthesis
• CPC Class Codes: A61B 2034/2055 Optical tracking systems
• CPC Class Codes: A61B 34/20 Surgical navigation systems; Devices for tracking or guiding surgical instruments, e.g. for frameless stereotaxis
• CPC Class Codes: A61B 90/36 Image-producing devices or illumination devices not otherwise provided for
• CPC Class Codes: A61B 90/98 using electromagnetic means, e.g. transponders

Abstract

A device and method for automatically verifying, calibrating and surveying a navigable surgical instrument, wherein by means of a scanning device, the geometry of the instrument, in particular the shape of the functional elements (e.g., tips) and their spatial position with respect to an attachable reference system, are detected. By means of a data processing unit, a three-dimensional model of the instrument is calculated from the detected information concerning the geometry of the instrument including the reference system, wherein verification, calibration or surveying is performed with the aid of the ascertained information concerning the geometry of the instrument.

Claims

1. A method for automatically verifying, calibrating or surveying an instrument, said instrument including a reference system, the method comprising:

detecting a geometry of i) the instrument and ii) the reference system based on a scan of the instrument and the reference system;

calculating a three-dimensional model of the instrument based on the detected geometry of the instrument and the reference system;

verifying, calibrating or surveying the instrument based on the geometry of the three-dimensional model;

recording, via a camera unit, emission characteristics and/or reflection characteristics of the reference system from different angles of observation;

ascertaining from the emission characteristics and/or reflection characteristics a quality, condition or shape of the reference system or of individual markers of the reference system based on the angle of observation;

calculating an optical outline of the reference system from the ascertained quality, condition or shape of the reference system and/or of the individual markers of the reference system; and

combining the optical outline of the reference system with the ascertained quality, condition or shape of the reference system or with the individual markers of the reference system.

2. The method of claim 1, wherein said reference system is formed by at least two active or passive markers.

3. The method of claim 1, wherein calculating includes using a data processing unit to perform the calculations.

4. The method of claim 1, wherein verifying or calibrating comprises:

recognizing the geometry of the reference system or the geometry of a functional element of the instrument;

comparing at least one of the recognized geometry of the reference system or the recognized geometry of the functional element with data corresponding to geometries of functional elements and/or reference systems of other instruments, wherein said data is stored in memory; and

automatically retrieving information stored in memory for the instrument based on the comparison.

5. The method of claim 1, further comprising:

detecting a surface of the instrument via the scan; and

representing the detected surface on a display device as a three-dimensional model of the instrument, such that a functional element and the reference system of the instrument can be selected by a user via a user interface unit.

6. The method of claim 5, wherein detecting the surface includes detecting the reference system and a functional element of the instrument.

7. The method of claim 1, wherein if a deviation between the detected geometry of the instrument and geometric data stored in memory is less than or equal to a predetermined tolerance level, the instrument being examined and the geometric data stored in memory are assumed to match and a positive verification result is transmitted to a navigation system, whereupon navigation of the instrument is activated for a subsequent application.

8. The method of claim 1, wherein detecting a geometry comprises:

calculating a distance between a functional element of the instrument and the reference system;

transmitting the calculated distance to a navigation system.

9. The method of claim 1, further comprising detecting data corresponding to a surface of the instrument as the instrument is rotated about a scanning unit, wherein the three dimensional model of the instrument is calculated using the detected surface and rotation data.

10. A method for navigating an instrument, comprising:

verifying, calibrating or surveying the instrument according to claim 1;

detecting a spatial position of the reference system;

determining a spatial position of a functional element of the instrument based on geometric data regarding the reference system, said data stored in computer memory; and

providing on a display the spatial position of the functional element relative to an anatomical structure to be treated.

11. A non-transitory computer readable medium comprising computer executable instructions adapted to cause a processor to perform the method of claim 1.

12. A method for automatically verifying, calibrating or surveying an instrument, said instrument including a reference system, the method comprising:

detecting a geometry of the instrument and the reference system based on a scan of the instrument and the reference system, wherein detecting comprises

obtaining a first scan of the instrument at a first resolution;

ascertaining a first geometric structure of the of the instrument based on the first scan;

comparing the first geometric structure with geometric data stored in memory; and

retrieving information stored in memory for the instrument based on the comparison;

calculating a three-dimensional model of the instrument based on the detected geometry of the instrument and the reference system; and

verifying, calibrating or surveying the instrument based on the geometry of the three-dimensional model.

13. The method of claim 12, further comprising verifying or calibrating the instrument after the instrument has been identified, wherein verifying or calibrating comprises:

obtaining a second scan of functional elements of the instrument and the reference system at a second resolution, wherein the second resolution is higher than the first resolution;

comparing data from the second scan with geometric data stored in memory, said geometric data relating to the instrument.

14. The method of claim 13, wherein obtaining a second scan includes scanning the shape and position of the functional elements and the reference system with respect to one another.

15. The method of claim 13, wherein calibration comprises correcting geometric instrument data stored in memory when a deviation between the detected instrument geometry and the geometric instrument data stored in memory is greater than a predetermined tolerance level,

wherein said correction is based on the ascertained geometry of the instrument, or said correction is based on data obtained during a new scan of the instrument in areas of the instrument that are not within the predetermined tolerance.

16. A method for automatically verifying, calibrating or surveying an instrument, said instrument including a reference system, the method comprising:

detecting a geometry of the instrument and the reference system based on a scan of the instrument and the reference system;

calculating a three-dimensional model of the instrument based on the detected geometry of the instrument and the reference system; and

verifying, calibrating or surveying the instrument based on the geometry of the three-dimensional model, wherein surveying the instrument comprises

obtaining a first scan of the instrument and reference system at a first resolution;

calculating a three-dimensional model of the instrument from the first scan;

providing the model on a display device;

locating characteristic shapes forming the model;

ascertaining a scan area based on the characteristic shapes; and

obtaining a second scan of the ascertained scan area at a second resolution, wherein the second resolution is higher than the first resolution.

17. The method of claim 16, wherein locating characteristic shapes includes locating geometric shapes of the reference system or a functional element of the instrument.

18. A device for automatically verifying, calibrating or surveying an instrument, comprising:

a scanning unit configured to detect a three-dimensional geometry of the instrument, a three-dimensional geometry of a reference system attachable on the instrument, and the geometry of the reference system relative to the geometry of the instrument, wherein the instrument can be rotated relative to the scanning unit;

an infrared camera unit, wherein a spatial position of the camera unit with respect to the scanning unit is known or can be determined, and wherein the camera unit is operable to determine emission characteristics or reflection characteristics of the reference system and/or markers of the reference system; and

a data processing unit communicatively coupled to the scanning unit and the infrared camera unit, the data processing unit configured to

calculate a three-dimensional model of the instrument and ascertain a position of a functional element of the instrument, said calculation based on a characteristic arrangement of the reference system,

based on the emission or reflection characteristics ascertain a condition, quality or a shape of the reference system or of individual markers of the reference system based on the angle of observation,

calculate an optical outline of the reference system from the ascertained quality, condition or shape of the reference system and/or of the individual markers of the reference system, and

combine the optical outline of the reference system with the ascertained quality, condition or shape of the reference system or with the individual markers of the reference system.

19. The device of claim 18, further comprising a database, wherein at least one of the detected information concerning the geometry of the instrument and the reference system, information concerning the condition, quality or shape of the markers, information concerning the geometry of other instruments and their reference systems, or information concerning the condition, quality or shape of the markers of other instruments can be saved in the database.

20. The device of claim 19, wherein information concerning the reference system includes a distance from the reference system to a functional element of the instrument.

21. The device of claim 18, further comprising:

a display device on which the ascertained three-dimensional model of the instrument can be represented; and

a user interface unit configured for selecting a functional element of the instrument or the markers forming the reference system.

22. The device of claim 21, wherein the display device is a touch screen, and the user interface is arranged on the touch screen.

23. The device of claim 18, further comprising a navigation system linked wirelessly or via a wired connection to the data processing unit, wherein the ascertained information concerning the instrument can be transmitted to the navigation system, and on the basis of the transferred information concerning the arrangement of the markers forming the reference system, a navigation procedure can be carried out using the navigation system and incorporating and/or compensating for ascertained errors of the markers.

24. The device of claim 18, further comprising a communication device for communicating with an instrument equipped with a mobile, read-only or readable and writeable data memory, wherein identifying features of the instrument are provided to the data processing unit and/or the scanning unit via the communication link.

25. The device of claim 24, wherein the communication device uses wireless transfer technologies.

26. The device of claim 18, further comprising an instrument holder configured to hold the instrument relative to the scanning unit, wherein the instrument holder and scanning unit are configured for relative movement to each other.

27. A program embodied on a non-transitory computer-readable medium for automatically verifying, calibrating or surveying an instrument that includes a reference system, comprising:

code that determines a geometry of i) the instrument and ii) the reference system, said determination based on scan data of the instrument and scan data of the reference system;

code that calculates a three-dimensional model of the instrument based on the detected geometry of the instrument and the reference system; and

code that verifies, calibrates or surveys the instrument based on the geometry of the three-dimensional model

code that records emission characteristics and/or reflection characteristics of the reference system from different angles of observation;

code that ascertains from the emission characteristics and/or reflection characteristics a quality, condition or shape of the reference system or of individual markers of the reference system based on the angle of observation;

code that calculates an optical outline of the reference system from the ascertained quality, condition or shape of the reference system and/or of the individual markers of the reference system; and

code that combines the optical outline of the reference system with the ascertained quality, condition or shape of the reference system or with the individual markers of the reference system.