Laser-triggered plasma apparatus for atomic emission spectroscopy

• US 7,821,634 B2
• Filed: 04/18/2008
• Issued: 10/26/2010
• Est. Priority Date: 04/20/2007
• Status: Expired due to Fees

• Current Assignee: Thermo Niton Analyzers LLC (Thermo Fisher Scientific Incorporated)
• Original Assignee: Thermo Niton Analyzers LLC (Thermo Fisher Scientific Incorporated)
• Inventors: Dillon, Robert, Melikian, Stephanie, Grodzins, Lee
• Primary Examiner(s): Geisel; Kara E
• Application Number:
  US12/106,233
• Publication Number:
  US 20080259330A1
• Time in Patent Office: 921 Days
• Field of Search: 356/318, 356/72
• US Class Current: 356/318
• CPC Class Codes: G01J 3/02 Details
• CPC Class Codes: G01J 3/0272 Handheld
• CPC Class Codes: G01J 3/443 Emission spectrometry
• CPC Class Codes: G01N 21/67 using electric arcs or discharges
• CPC Class Codes: G01N 21/718 Laser microanalysis, i.e. with formation of sample plasma

Abstract

Multiple energy sources, such as a laser and electrical current, are employed, in close coordination, spatially and temporally, to clean a sample, vaporize its material and excite vapor atoms for the purpose of atomic emission spectroscopy. These methods permit better monitoring and control of the individual processes in real time, lead to higher consistency and higher quality optical emission spectra, and enhance the measurements of non-conducting solids, liquids and gases. Additionally, a portable instrument is provided with both laser source and spectrometer optically coupled to a hand-holdable unit.

Claims

1. A method for analyzing composition of a sample with an optical spectroscopic instrument, the sample characterized by a threshold ablation energy per unit area with respect to the instrument, and by a surface at an interface between the sample and a gas, the method comprising:

a. creating a plasma at a specified location in the gas proximate to an area at the surface of the sample by application of a first electromagnetic field characterized by a first spectral range and a second electromagnetic field characterized by a second spectral range, wherein at least one of the first and second electromagnetic fields is applied in a pulse of energy per unit area less than the threshold ablation energy; and

b. detecting resonant emission emitted by atoms of the sample vaporized into the plasma.

2. A method in accordance with claim 1, wherein the first electromagnetic field is an optical pulse of energy less that the threshold ablation energy.

3. A method in accordance with claim 1, wherein the second electromagnetic field is a static field.

4. A method in accordance with claim 1, wherein the first electromagnetic field creates a discharge within the gas and the second electromagnetic field additionally sustains the discharge.

5. A method in accordance with claim 1, wherein the step of creating a plasma includes irradiating the specified location with a laser beam.

6. A method in accordance with claim 5, further comprising applying a high-voltage bias across a spatial region prior to irradiating the specified location with the laser beam.

7. A method in accordance with claim 6, wherein the high-voltage bias is of constant polarity.

8. A method in accordance with claim 6, wherein the high-voltage bias is of alternating polarity.

9. A method in accordance with claim 1, further comprising a step of sustaining the plasma.

10. A method in accordance with claim 9 wherein the step of sustaining the plasma includes inducing a current between a pair of electrodes in a vicinity of the specified location.

11. A method in accordance with claim 1, wherein the step of creating a plasma includes focusing a laser pulse with an optical element.

12. A method in accordance with claim 9, wherein the step of sustaining the plasma includes inducing a current between a plurality of pairs of electrodes jointly comprising an electrode structure in a vicinity of the specified location.

13. A method in accordance with claim 1, wherein the step of detecting resonant emission includes dispersing the emission in a spectrometer.

14. A method in accordance with claim 1, further including a step of cleaning the surface with the discharge.

15. A method in accordance with claim 8, further including a step of creating a further discharge by means of either a second laser pulse or a second arc discharge.

16. A method for analyzing composition of a sample with an optical spectroscopic instrument, the sample characterized by a surface at an interface between the sample and a gas, the method comprising:

a. applying an non-ionizing electrical bias field across a volume of the gas proximate to an area at the surface;

b. triggering creation of a plasma at a specified location within the volume by application of an optical pulse; and

c. detecting resonant emission emitted by atoms of the sample vaporized into the plasma.

17. A method in accordance with claim 16, further comprising a step of sustaining the plasma.

18. A method in accordance with claim 17, wherein the step of sustaining the plasma includes inducing a current between a plurality of pairs of electrodes jointly comprising an electrode structure in a vicinity of the specified location.

19. A portable apparatus for analyzing composition of a sample characterized by a threshold ablation energy and by a surface at an interface between the sample and a gas, the apparatus comprising:

a. a hand-holdable unit for conducting spectrometric analysis in close proximity to the sample;

b. a laser optically coupled to the hand-holdable unit for providing pulses of optical energy;

c. an optical element disposed entirely within the hand-holdable unit for focusing the optical energy to create a plasma at a controlled location in a proximity of the sample;

d. an electrode structure coupled to the hand-holdable unit for sustaining a discharge within the plasma;

e. a spectrometer optically coupled to the hand-holdable unit for dispersing resonant emission emitted by atoms onto at least one detector; and

f. a processor for receiving a signal from the at least one detector and determining, therefrom, a characteristic of the sample.

20. An apparatus in accordance with claim 19, further comprising a polarization control element for aligning polarization of the optical pulses in relation to the electrode structure.

21. An apparatus in accordance with claim 19, further comprising a bias supply for applying an electric field across the controlled location in the proximity of the sample prior to providing successive pulses of optical energy.