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Laser-triggered plasma apparatus for atomic emission spectroscopy

  • US 7,821,634 B2
  • Filed: 04/18/2008
  • Issued: 10/26/2010
  • Est. Priority Date: 04/20/2007
  • Status: Expired due to Fees
First Claim
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1. A method for analyzing composition of a sample with an optical spectroscopic instrument, the sample characterized by a threshold ablation energy per unit area with respect to the instrument, and by a surface at an interface between the sample and a gas, the method comprising:

  • a. creating a plasma at a specified location in the gas proximate to an area at the surface of the sample by application of a first electromagnetic field characterized by a first spectral range and a second electromagnetic field characterized by a second spectral range, wherein at least one of the first and second electromagnetic fields is applied in a pulse of energy per unit area less than the threshold ablation energy; and

    b. detecting resonant emission emitted by atoms of the sample vaporized into the plasma.

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