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Devices and systems having at least one dam structure

  • US 7,833,894 B2
  • Filed: 07/23/2007
  • Issued: 11/16/2010
  • Est. Priority Date: 09/01/2005
  • Status: Active Grant
First Claim
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1. A semiconductor die, comprising:

  • at least one through via extending from a first surface to a second surface of the semiconductor die, the at least one through via including a solder-wetting metal layer formed over a sidewall thereof and a solder positioned therein;

    at least one dam structure disposed over an end of the at least one through via proximate at least one of the first surface and the second surface, the at least one dam structure comprising another conductive material formulated and configured to retain the solder in the at least one through via when the solder is in a molten state; and

    at least another dam structure disposed over another end of the at least one through via; and

    wherein at least one dam structure is electrically connected to a bond pad disposed on the at least one of the first surface and the second surface of the semiconductor die.

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