Evaluation method of organic or bio-conjugation on nanoparticles using imaging of time-of-flight secondary ion mass spectrometry

• US 7,838,257 B2
• Filed: 04/29/2008
• Issued: 11/23/2010
• Est. Priority Date: 12/11/2007
• Status: Active Grant

• Current Assignee: Korea Research Institute of Standards and Science
• Original Assignee: Korea Research Institute of Standards and Science
• Inventors: Lee, Tea Geol, Moon, Dae Won, Min, Hyegeun
• Primary Examiner(s): Cook; Lisa V
• Application Number:
  US12/149,223
• Publication Number:
  US 20090148862A1
• Time in Patent Office: 938 Days
• Field of Search: None
• US Class Current: 435/7.21
• CPC Class Codes: G01N 33/54346 Nanoparticles
• CPC Class Codes: G01N 33/54353 with ligand attached to the carrier via a chemical coupling agent coatings G01N33/54393
• CPC Class Codes: H01J 49/0004 Imaging particle spectrometry
• CPC Class Codes: Y10T 436/143333 Saccharide [e.g., DNA, etc.]
• CPC Class Codes: Y10T 436/24 Nuclear magnetic resonance, electron spin resonance or other spin effects or mass spectrometry

Abstract

A method of evaluating conjugation between materials using imaging of time-of-flight secondary ion mass spectrometry (TOF-SIMS) according to the present invention is carried out by following the steps, a) forming a spontaneous pattern on a substrate with a mixture containing nanoparticles and a conjugation material selected from organic, bio or inorganic material, b) obtaining an ion detection pattern from the conjugation material and nanoparticles, respectively, depending on their position on the substrate by using time-of-flight secondary ion mass spectrometry, and c) determining whether the conjugation is formed between the conjugation material and nanoparticles by comparing the ion detection pattern of the conjugation material with the ion detection pattern of the nanoparticles.

Claims

1. A method of evaluating conjugation between materials using TOF-SIMS (Time-Of-Flight Secondary Ion Mass Spectrometry) comprising the steps of:

a) forming a spontaneous pattern on a substrate with a mixture comprising nanoparticles and a conjugation material selected from organic, bio or inorganic material;

b) obtaining an ion detection pattern from said conjugation material and said nanoparticles, respectively, depending on their position on the substrate by using TOF-SIMS; and

c) determining whether the conjugation is formed between said conjugation material and said nanoparticles by comparing the ion detection pattern of said conjugation material with the ion detection pattern of said nanoparticles.

2. The method of evaluating conjugation between materials using TOF-SIMS of claim 1, wherein the ion detection patterns of the conjugation materials and the nanoparticles at said step b) are separately measured for the same area on the substrate, and correspond to intensity of each ion which carries two-dimensional position information obtained from area scan by TOF-SIMS.

3. The method of evaluating conjugation between materials using TOF-SIMS of claim 2, wherein the ion detection pattern of said nanoparticles is a binary pattern, i.e., position information (x, y) showing a detection value for the ions of nanoparticles more than specific critical intensity is transformed value 1, while position information (x, y) showing a detection value less than specific critical intensity is transformed value 0;

and the ion detection pattern of said conjugation material is a binary pattern, i.e., position information (x, y) showing a detection value for the ions of conjugation material more than specific critical intensity is transformed value 1, while position information (x, y) showing a detection value less than specific critical intensity is transformed value 0.

4. The method of evaluating conjugation between materials using TOF-SIMS of claim 1, wherein it is determined that such conjugation materials and nanoparticles are conjugated to each other when the ion detection pattern of said conjugation materials and the ion detection pattern of said nanoparticles are present at the same position.

5. The method of evaluating conjugation between materials using TOF-SIMS of claim 3, wherein said method comprises the steps of:

calculating a reference, which is the total number of position information having value 1 on binary pattern of said nanoparticle ions;

calculating a conjugation amount, which is the total number of position information wherein both the binary pattern of the ions of said nanoparticle and the binary pattern of the ions of said conjugation materials have value 1 at the same position information; and

calculating a conjugation level which indicates a degree of conjugation of said conjugation materials to said nanoparticles, by dividing said conjugation amount by said reference.

6. The method of evaluating conjugation between materials using TOF-SIMS of claim 3, wherein said method comprises the steps of:

calculating a total amount, which is the total number of position information having value 1 on binary pattern of the ions of said conjugation material;

calculating a conjugation amount, which is the total number of position information in which both the binary pattern of the ions of said conjugation material and the binary pattern of the ions of said nanoparticles have value 1 at the same position information; and

calculating a conjugation level which indicates the degree of conjugation of said conjugation materials to said nanoparticles, by dividing said conjugation amount by said total amount.

7. The method of evaluating conjugation between materials using TOF-SIMS of claim 2, wherein said step c) is carried out by the steps of:

transforming said position information into an image pixel; and

imparting color, brightness or chroma to said pixel depending on ion intensity based on said position information, thus resulting a transformation of each ion detection pattern of said nanoparticles and said conjugation materials into an ion detection image of the nanoparticles and an ion detection image of the conjugation materials respectively, and when the ion detection image of said nanoparticles and the ion detection image of said conjugation materials are overlapped to each other, it is determined that said conjugation materials are conjugated to said nanoparticles.

8. The method of evaluating conjugation between materials using TOF-SIMS of claim 1, wherein said conjugation materials have a thiol group and additionally have one more functional group selected from carboxyl group, hydroxyl group and amino group.

9. The method of evaluating conjugation between materials using TOF-SIMS of claim 1, wherein said conjugation materials are an antibody or a nucleotide.

10. The method of evaluating conjugation between materials using TOF-SIMS of claim 2, wherein said conjugation materials are an antibody, a cell, or a nucleotide and on their surface the nanoparticles have functional groups that can specifically conjugate to said antibody or cell or functional groups that can complementarily conjugate to said nucleotide.

11. The method of evaluating conjugation between materials using TOF-SIMS of claim 10, wherein the ion detection pattern of said nanoparticles is the ion detection pattern of said functional groups.

12. The method of evaluating conjugation between materials using TOF-SIMS of claim 11, wherein the ion detection pattern of said functional groups is a binary pattern, i.e., position information (x, y) from which the ions of the functional groups have been detected with an intensity more than a specific critical intensity is given value 1, and position information having a detection intensity less than a specific critical intensity is given value 0;

the ion detection pattern of said conjugation materials is a binary pattern, i.e., position information (x, y) from which the ions of the conjugation materials have been detected with an intensity more than a specific critical intensity is given value 1, and position information having a detection intensity less than a specific critical intensity is given value 0.

13. The method of evaluating conjugation between materials using TOF-SIMS of claim 12, wherein said method comprises the steps of:

calculating a reference, which is the total number of position information having value 1 on binary pattern of the ions of said functional group;

calculating a conjugation amount, which is the total number of position information wherein both the binary pattern of the ions of said functional group and the binary pattern of the ions of said conjugation materials have value 1 at the same position information; and

calculating a conjugation level, which indicates a degree of conjugation of said conjugation materials to said functional groups, by dividing said conjugation amount by said reference.

14. The method of evaluating conjugation between materials using TOF-SIMS of claim 2, wherein it is determined that such conjugation materials and nanoparticles are conjugated to each other when the ion detection pattern of said conjugation materials and the ion detection pattern of said nanoparticles are present at the same position.

15. The method of evaluating conjugation between materials using TOF-SIMS of claim 3, wherein it is determined that such conjugation materials and nanoparticles are conjugated to each other when the ion detection pattern of said conjugation materials and the ion detection pattern of said nanoparticles are present at the same position.