Gate dielectric first replacement gate processes and integrated circuits therefrom
First Claim
1. A method comprising:
- forming a gate dielectric layer on PMOS regions for PMOS devices and NMOS regions for NMOS devices;
forming an original gate electrode layer on the gate dielectric layer in both the PMOS regions and the NMOS regions, wherein the original gate electrode layer is doped with material of a first conductivity type;
applying a gate masking layer on the gate electrode layer;
etching to pattern the original gate electrode layer to simultaneously form original gate electrodes for PMOS devices and NMOS devices;
forming source/drain regions for the PMOS devices and the NMOS devices;
removing the original gate electrodes for at least one of the PMOS devices and the NMOS devices to form trenches using an wet etch process with a wet etch solution, wherein the wet etch solution is more reactive with layers doped with the first conductivity type than layers doped with a second conductivity type, and wherein the wet etch solution is generally nonreactive with the gate dielectric layer, and wherein at least a portion of the gate dielectric layer is preserved; and
forming replacement gates in the trenches.
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Accused Products
Abstract
A method for fabricating a CMOS integrated circuit (IC) and ICs therefrom includes the steps of providing a substrate having a semiconductor surface, wherein the semiconductor surface has PMOS regions for PMOS devices and NMOS regions for NMOS devices. A gate dielectric layer is formed on the PMOS regions and NMOS regions. An original gate electrode layer is formed on the gate dielectric layer. A gate masking layer is applied on the gate electrode layer. Etching is used to pattern the original gate electrode layer to simultaneously form original gate electrodes for the PMOS devices and NMOS devices. Source and drain regions are formed for the PMOS devices and NMOS devices. The original gate electrodes are removed for at least one of the PMOS devices and NMOS devices to form trenches using an etch process, such as a hydroxide-based solution, wherein at least a portion and generally substantially all of the gate dielectric layer is preserved. A metal comprising replacement gates is formed in the trenches, and fabrication of the IC is completed.
25 Citations
24 Claims
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1. A method comprising:
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forming a gate dielectric layer on PMOS regions for PMOS devices and NMOS regions for NMOS devices; forming an original gate electrode layer on the gate dielectric layer in both the PMOS regions and the NMOS regions, wherein the original gate electrode layer is doped with material of a first conductivity type; applying a gate masking layer on the gate electrode layer; etching to pattern the original gate electrode layer to simultaneously form original gate electrodes for PMOS devices and NMOS devices; forming source/drain regions for the PMOS devices and the NMOS devices; removing the original gate electrodes for at least one of the PMOS devices and the NMOS devices to form trenches using an wet etch process with a wet etch solution, wherein the wet etch solution is more reactive with layers doped with the first conductivity type than layers doped with a second conductivity type, and wherein the wet etch solution is generally nonreactive with the gate dielectric layer, and wherein at least a portion of the gate dielectric layer is preserved; and forming replacement gates in the trenches. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14)
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15. A method comprising:
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providing a substrate having a semiconductor surface, the semiconductor surface having PMOS regions for PMOS devices and NMOS regions for NMOS devices; forming a gate dielectric layer on the PMOS regions and the NMOS regions, wherein the gate dielectric layer comprises a high-k dielectric material having a k-value that is greater than 10; forming an original polysilicon comprising gate electrode layer on the gate dielectric; doping the original polysilicon comprising gate electrode layer in both the PMOS regions and the NMOS regions n-type to a doping level of at least 1×
1018 cm −
3;applying a gate masking layer on the original polysilicon comprising gate electrode layer; etching to pattern the original polysilicon comprising gate electrode layer to simultaneously form original gate electrodes for the PMOS devices and the NMOS devices; forming source/drain regions for the PMOS devices and the NMOS devices; depositing at least one pre-planarization dielectric layer; chemical mechanical polishing to planarize and expose the original gate electrodes; removing the original gate electrodes for the PMOS devices and the NMOS devices to form trenches using a wet etch solution comprising at least one non-alkali hydroxide solution, wherein at least a portion of the high-k gate dielectric layer is preserved; and forming replacement gates in the trenches. - View Dependent Claims (16)
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17. A method comprising:
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forming a gate dielectric layer on a substrate; forming an original gate electrode layer on the gate dielectric layer, wherein the original gate dielectric layer is doped with an N-type material; patterning the original gate electrode layer to form gate electrodes for a plurality of NMOS transistors and a plurality of PMOS transistors; forming source/drain regions for the PMOS and NMOS transistors; forming an etch stop layer over the NMOS and PMOS transistors; forming a photoresist layer over the at least one of the NMOS transistors and the PMOS transistors so that a portion of the etch stop layer is exposed; removing the exposed etch stop layer; removing exposed original gate electrodes with a wet etch solution to form trenches, wherein the wet etch solution is more reactive with layers doped with N-type materials than layers doped with P-type materials, and wherein the wet etch solution is generally nonreactive with the gate dielectric layer; and forming replacement gates electrodes in the trenches. - View Dependent Claims (18, 19, 20, 21, 22, 23, 24)
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Specification