Parallel testing in a per-pin hardware architecture platform
First Claim
1. A measurement system for testing a device under test (DUT), said system comprising:
- a plurality of testing devices for interacting with the DUT and conducting a plurality of different tests on the DUT;
a computer-readable memory for storing computer-executable instructions defining the plurality of tests to be conducted by the testing devices on the DUT;
a scheduler component for designating at least a first test and a second test from the plurality of tests to be conducted on the DUT in parallel, wherein said designating is based at least in part on content of the computer-executable instructions defining the first test and the second test;
a controller operable to read and execute said computer-executable instructions, said controller initiating the first test and the second test to be conducted in parallel and initiating at least a third test sequentially after at least one of the first and second tests wherein said first test, said second test and said third test may or may not be unique and the scheduler component comprises;
a query component for identifying from the computer-executable instructions defining the first and second tests a testing device resource to be utilized in conducting each of the first and second tests;
a comparison component for comparing the testing device resource to be utilized in conducting the first test to the testing device resource to be utilized in conducting the second test; and
a logic component for determining that the testing device resource to be utilized in conducting the first test does not conflict with the testing device resource to be utilized in conducting the second test.
1 Assignment
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Accused Products
Abstract
Provided is a method and system for testing a DUT. The system includes a plurality of testing devices for interacting with the DUT and conducting a plurality of different tests on the DUT, and a computer-readable memory for storing computer-executable instructions defining the plurality of tests to be conducted by the testing device on the DUT. A scheduler component designates at least a first test and a second test from the plurality of tests to be conducted on the DUT in parallel, wherein said designating is based at least in part on content of the computer-executable instructions defining the first test and the second test. And a controller initiates the first test and the second test to be conducted in parallel and initiating at least a third test sequentially relative to at least one of the first and second tests.
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Citations
14 Claims
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1. A measurement system for testing a device under test (DUT), said system comprising:
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a plurality of testing devices for interacting with the DUT and conducting a plurality of different tests on the DUT; a computer-readable memory for storing computer-executable instructions defining the plurality of tests to be conducted by the testing devices on the DUT; a scheduler component for designating at least a first test and a second test from the plurality of tests to be conducted on the DUT in parallel, wherein said designating is based at least in part on content of the computer-executable instructions defining the first test and the second test; a controller operable to read and execute said computer-executable instructions, said controller initiating the first test and the second test to be conducted in parallel and initiating at least a third test sequentially after at least one of the first and second tests wherein said first test, said second test and said third test may or may not be unique and the scheduler component comprises; a query component for identifying from the computer-executable instructions defining the first and second tests a testing device resource to be utilized in conducting each of the first and second tests; a comparison component for comparing the testing device resource to be utilized in conducting the first test to the testing device resource to be utilized in conducting the second test; and a logic component for determining that the testing device resource to be utilized in conducting the first test does not conflict with the testing device resource to be utilized in conducting the second test. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A method of testing a device under test (DUT) to determine if the DUT functions properly, the method comprising:
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querying with a controller computer-executable instructions defining a plurality of tests stored by a computer-readable medium for a conflict between the tests, wherein said conflict interferes with conducting the tests in parallel; based on said querying, scheduling a first test and a second test that is compatible with the first test to be conducted on the DUT in parallel; based on said querying, scheduling a third test that conflicts with the first test to be conducted on the DUT sequentially after the first test wherein said first test, said second test and said third test may or may not be unique; and said querying comprising; identifying from the computer-executable instructions defining the first and second tests a testing device resource to be utilized in conducting each of the first and second tests; comparing the testing device resource to be utilized in conducting the first test to the testing device resource to be utilized in conducting the second test; and determining that the testing device resource to be utilized in conducting the first test does not conflict with the testing device resource to be utilized in conducting the second test; and performing said tests. - View Dependent Claims (10, 11, 12, 13, 14)
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Specification