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Anti-fuse latch self-test circuit and method

  • US 7,859,925 B1
  • Filed: 03/21/2007
  • Issued: 12/28/2010
  • Est. Priority Date: 03/31/2006
  • Status: Active Grant
First Claim
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1. A programmable latch circuit, comprising:

  • a volatile latch circuit that latches a data value according to a potential difference between a first data node and a second data node;

    an anti-fuse circuit that includes a first anti-fuse structure coupled between a program node and the first data node, and a second anti-fuse structure coupled between the program node and the second data node; and

    a test circuit that includes at least a first test current path coupled to the first node that provides a first test current to the first node in response to a first test signal, and a controllable current source that establishes the magnitude of the first test current.

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