Calibration method and apparatus

• US 7,866,056 B2
• Filed: 02/18/2008
• Issued: 01/11/2011
• Est. Priority Date: 02/22/2007
• Status: Active Grant

• Current Assignee: Renishaw PLC
• Original Assignee: Renishaw PLC
• Inventors: Sutherland, Alexander Tennant, Ould, John Charles
• Primary Examiner(s): GUADALUPE, YARITZA
• Application Number:
  US12/449,148
• Publication Number:
  US 20100018069A1
• Time in Patent Office: 1,058 Days
• Field of Search: 335/02, 335/03, 335/04, 33556-561
• US Class Current: 33/503
• CPC Class Codes: G01B 21/042 Calibration or calibration artifacts G01B3/30, G01B9/02072 take precedence

Abstract

A method is described for calibrating apparatus including a measurement probe mounted on a machine, such as a machine tool. The machine is arranged to capture machine position data indicative of the position of the measurement probe and the measurement probe is arranged to capture probe data indicative of the position of a surface relative to the measurement probe. The measurement probe may be an analogue or scanning probe having a deflectable stylus. The first step of the method involves moving the measurement probe at a known speed relative to an artefact whilst capturing probe data and machine position data. In particular, the measurement probe is moved along a path that enables probe data to be captured that is indicative of the position of two or more points on the surface of the artefact relative to the measurement probe. A second step of the method comprises analyzing the machine position data and the probe data and determining from that data the relative delay in capturing probe data and machine position data (i.e. the so-called system delay).

Claims

1. A method for calibrating apparatus comprising a measurement probe mounted on a machine, the machine being arranged to capture machine position data indicative of the position of the measurement probe relative to an artefact, the measurement probe being arranged to capture probe data indicative of the position of a surface relative to the measurement probe, the method comprising the steps of;

(i) moving the measurement probe at a known speed relative to the artefact whilst capturing probe data and machine position data, the measurement probe being moved along a path that enables probe data to be captured that is indicative of the position of two or more points on the surface of the artefact relative to the measurement probe; and

(ii) analysing the machine position data and the probe data captured during step (i) and determining therefrom the relative delay in capturing probe data and machine position data.

2. A method according to claim 1, in which the measurement probe is a scanning probe having a deflectable stylus and the probe data is indicative of stylus deflection, wherein step (i) comprises using the machine to move the measurement probe along a path that causes the stylus of the measurement probe to be brought into contact with each of said two or more points on the surface of the artefact.

3. A method according to claim 2, wherein step (i) comprises continuing movement of the measurement probe relative to the artefact for a limited distance after initial contact between the stylus and a point on the surface of the artefact has been made and step (ii) comprises performing an extrapolation to calculate two or more measured points on the artefact surface.

4. A method according to claim 3, wherein the two or more measured points are derived from probe data and machine position data that are captured as the probe is being moved away from the surface of the artefact.

5. A method according to claim 2, wherein the stylus of the measurement probe is brought into contact with each point on the surface of the artefact from a direction substantially perpendicular to the surface of the artefact.

6. A method according to claim 1, wherein step (ii) comprises using the probe data and the machine position data to calculate the position of two or more measured points on the artefact surface.

7. A method according to claim 6, wherein the two or more points on the surface of the artefact of step (i) are selected to permit at least one dimension of the artefact to be measured.

8. A method according to claim 7, wherein step (ii) comprises calculating said delay by comparing the at least one measured dimension of the artefact with a known dimension of the artefact.

9. A method according to claim 6, wherein the two or more points on the surface of the artefact comprise at least one pair of opposed points.

10. A method according to claim 1, wherein step (i) is performed a plurality of times with the measurement probe being moved at a plurality of different known speeds.

11. A method according to claim 10, wherein step (ii) comprises determining at least one measured dimension of the artefact at each of said plurality of speeds and determining the delay between the probe data and the machine position data from said at least one measured dimension of the artefact as a function of speed.

12. A method according to claim 11, wherein the delay is determined from the gradient of measured dimension versus speed data.

13. A method according to claim 1, wherein the artefact comprises a sphere and step (i) comprises capturing probe data indicative of the position of at least five points on the surface of the sphere.

14. A method according to claim 1, wherein step (i) comprises moving the measurement probe along a path that permits a plurality of points along a surface contour of the artefact to be measured, wherein said path includes at least one change in the direction of measurement probe movement that can be identified from both the machine position data and the probe data.

15. A method according to claim 14, wherein said path includes a plurality of changes in the direction of probe movement that can be identified from both the machine position data and probe data.

16. A method according to claim 14, wherein step (ii) comprises comparing the machine position data and the probe data to establish the delay therebetween, said comparison comprising an iterative process to minimise differences between the changes in direction identifiable from the probe data and machine position data.

17. A method according to claim 1, wherein the machine position data and probe data are captured at intervals timed relative to a master clock.

18. A method according to claim 1, wherein the machine is a machine tool that comprises a numeric controller that outputs the machine position data.

19. A method according to claim 1, wherein the measurement probe outputs the probe data over a wireless link to a probe interface.

20. Apparatus comprising;

a measurement probe for capturing probe data indicative of the position of a surface relative to the measurement probe;

a machine for capturing machine position data indicative of the position of the measurement probe relative to an artefact located within the working area of the machine;

a controller comprising calibration means for moving the measurement probe at a known speed relative to the artefact whilst capturing probe data and machine position data, the calibration means moving the measurement probe along a path that enables the capture of probe data indicative of the position of two or more points on the surface of the artefact relative to the measurement probe;

wherein the controller comprises an analyser for determining the relative delay between the captured probe data and machine position data.

21. A method of calibrating apparatus comprising a measurement probe mounted on a machine, the machine being arranged to capture machine position data indicative of the position of the measurement probe relative to an artefact, the measurement probe being arranged to capture probe data indicative of the position of a surface relative to the measurement probe, the method comprising the steps of;

(i) moving the measurement probe at a known speed relative to the artefact whilst capturing probe data and machine position data, the measurement probe being moved along a path that enables the capture of probe data indicative of the position of at least one point on the surface of the artefact relative to the measurement probe, the path also including at least one change in the direction of probe movement that can be identified from the machine position data and the probe data; and

(ii) comparing the machine position data and probe data captured during the scan of step (i) and determining therefrom the relative time delay in capturing machine position data and probe data.