Apparatus and methods of detecting features on a microarray
First Claim
1. A method of performing a nondestructive quality control evaluation of a microarray comprising:
- providing a labeled control probe to a plurality of feature locations on the surface of a microarray substrate, the labeled control probe on the microarray emitting a control probe signal when excited by a light;
locating each feature location of said plurality of feature locations by detecting the control probe signal at each feature location of said plurality of feature locations, wherein said locating comprises interrogating the microarray;
evaluating data acquired from the interrogation, wherein evaluating comprises using the data acquired for modifying a subsequent deposition; and
subsequently depositing an oligomer test probe to each of said feature locations of the microarray based on the acquired data, such that a feature comprising the labeled control probe and the oligomer test probe is provided at each feature location.
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Abstract
A method of making a microarray apparatus with enhanced feature detectability provides for accurate detection of each feature location, regardless of the quality or quantity of signals from hybridized oligomer test probes. The method comprises separately providing a control probe or stilt and an oligomer test probe at each feature location on the microarray, such that each feature comprises a control probe and a test probe. The control probe comprises a sequence of nucleic acids unique to the control probe. The control probe is labeled with a label that emits a control signal. The oligomer test probe is labeled with a test label that emits a test signal distinguishable from the control signal. When the microarray is hybridized and interrogated, the control signal indicates the location of each and every feature on the array and the test signal indicates the location of hybridized oligomer test probes.
70 Citations
10 Claims
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1. A method of performing a nondestructive quality control evaluation of a microarray comprising:
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providing a labeled control probe to a plurality of feature locations on the surface of a microarray substrate, the labeled control probe on the microarray emitting a control probe signal when excited by a light; locating each feature location of said plurality of feature locations by detecting the control probe signal at each feature location of said plurality of feature locations, wherein said locating comprises interrogating the microarray; evaluating data acquired from the interrogation, wherein evaluating comprises using the data acquired for modifying a subsequent deposition; and subsequently depositing an oligomer test probe to each of said feature locations of the microarray based on the acquired data, such that a feature comprising the labeled control probe and the oligomer test probe is provided at each feature location. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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Specification