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Apparatus and methods of detecting features on a microarray

  • US 7,879,541 B2
  • Filed: 04/24/2003
  • Issued: 02/01/2011
  • Est. Priority Date: 10/26/2000
  • Status: Active Grant
First Claim
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1. A method of performing a nondestructive quality control evaluation of a microarray comprising:

  • providing a labeled control probe to a plurality of feature locations on the surface of a microarray substrate, the labeled control probe on the microarray emitting a control probe signal when excited by a light;

    locating each feature location of said plurality of feature locations by detecting the control probe signal at each feature location of said plurality of feature locations, wherein said locating comprises interrogating the microarray;

    evaluating data acquired from the interrogation, wherein evaluating comprises using the data acquired for modifying a subsequent deposition; and

    subsequently depositing an oligomer test probe to each of said feature locations of the microarray based on the acquired data, such that a feature comprising the labeled control probe and the oligomer test probe is provided at each feature location.

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