Processor performance adjustment system and method
First Claim
1. A processor adjustment system comprising:
- a processing unit for performing tasks;
a voltage source unit for generating a power signal for said processing unit;
a performance testing component for testing the performance of said processing unit to determine a high voltage level and a low voltage level at which said processing unit begins to fail;
a voltage control component for controlling the voltage level of said power signal within an envelope determined by said performance testing component, wherein said power signal voltage is increased for high performance tasks and reduced for low performance tasks of said processing unit, wherein said high performance tasks comprise rendering three-dimensional graphics images; and
a memory for storing test suite instructions for execution by said performance testing component.
1 Assignment
0 Petitions
Accused Products
Abstract
The present invention performance enhancement and reliability maintenance system and method pushes a processor to its maximized performance capabilities when performing processing intensive tasks (e.g., 3D graphics, etc). For example, a clock speed and voltage are increased until an unacceptable error rate begins to appear in the processing results and then the clock speed and voltage are backed off to the last setting at which excessive errors did not occur, enabling a processor at its full performance potential. The present invention also includes the ability to throttle back settings which facilitates the maintenance of desired reliability standards. The present invention is readily expandable to provide adjustment for a variety of characteristics in response to task performance requirements. For example, a variable speed fan that is software controlled can be adjusted to alter the temperature of the processor in addition to clock frequency and voltage.
293 Citations
68 Claims
-
1. A processor adjustment system comprising:
-
a processing unit for performing tasks; a voltage source unit for generating a power signal for said processing unit; a performance testing component for testing the performance of said processing unit to determine a high voltage level and a low voltage level at which said processing unit begins to fail; a voltage control component for controlling the voltage level of said power signal within an envelope determined by said performance testing component, wherein said power signal voltage is increased for high performance tasks and reduced for low performance tasks of said processing unit, wherein said high performance tasks comprise rendering three-dimensional graphics images; and a memory for storing test suite instructions for execution by said performance testing component. - View Dependent Claims (2, 3, 4, 5, 6, 7)
-
-
8. A processor adjustment system comprising:
-
a processing unit for performing processing tasks; a clock signal generating unit for generating a clock signal for said processing unit; a performance testing component for periodically testing the performance of said processing unit to determine an envelope including a high clock frequency and a low clock frequency at which said processing unit begins to fail; a clock control component for controlling the frequency of said clock signal within said envelope determined by said performance testing component, wherein said clock signal frequency is increased for high performance tasks and reduced for low performance tasks of said processing unit, wherein said high performance tasks comprise rendering three-dimensional graphics images; and a memory for storing test suite instructions for execution by said performance testing component. - View Dependent Claims (9, 10, 11, 12, 13, 14, 15, 16, 17)
-
-
18. A processor performance enhancement and reliability balancing method comprising:
-
storing test suite instructions in a memory for execution by a performance testing component; testing processor performance, wherein said testing comprises determining a high clock frequency and a low clock frequency at which said processor begins to fail; making an adjustment to reduce a failure rate; determining if said processor is engaged in a high performance task, wherein said high performance tasks comprise rendering three-dimensional graphics images; adjusting operating condition settings for a high performance task, including increasing the speed of a fan during said high performance task; determining if said processor is engaged in a low performance task; and adjusting operating condition setting for a low performance task, including decreasing the speed of a fan during said low performance task. - View Dependent Claims (19, 20, 21, 22, 23, 24, 25, 26, 27, 28)
-
-
29. A processor performance limitation testing method comprising:
-
adjusting the voltage level of a power supply signal supplied to a processor; altering the frequency of a clock signal that clocks said processor; determining combinations of voltage level values of said power signal and frequency values of said clock signal at which said processor begins to fail, said determining further comprising determining a high voltage and clock frequency and a low voltage and clock frequency at which said processor begins to fail; wherein said determining includes running a hardware self test and factoring results of said hardware self test into said determining combinations of voltage level values of said power signal and frequency values for different performance task, wherein a high performance task comprises rendering three-dimensional graphics images. - View Dependent Claims (30, 31, 32)
-
-
33. A computer system comprising:
-
a CPU; a memory coupled to said CPU for storing test suite instructions for execution by a performance testing component; a graphics processing unit for performing processing tasks; a control unit coupled to said CPU for controlling a clock signal and a power signal for said graphics processing unit, wherein the frequency of said clock signal and voltage level of said power signal is adjusted based upon user demanded performance, said user demanded performance including a high performance task comprising rendering three-dimensional graphics images; and wherein said control unit maintains said frequency of said clock signal and said voltage level of said power signal within an envelope determined by said control unit, wherein limitations of said envelope are defined by a high voltage and clock frequency and a low voltage and clock frequency at which said processor begins to produce errors at an unacceptable rate. - View Dependent Claims (34, 35)
-
-
36. A processor management method comprising:
-
storing test suite instructions in a memory for execution by a performance testing component; selecting a desired processor management objective, wherein said management objective is associated with a particular application type of task; analyzing an operating condition of a processor, wherein said analyzing comprises executing said test suite instructions to determine a high clock frequency and voltage and a low clock frequency and voltage at which the processor begins to fail; comparing said operating condition of said processor to an operating condition setting associated with said desired management objective; and adjusting said operating condition of said processor according to said desired processor management objective, wherein said task comprises a high performance task comprising rendering three dimensional graphics images. - View Dependent Claims (37, 38, 39, 40, 41, 42, 43, 44, 45, 46, 47, 48, 49, 50, 51, 52, 53, 54, 55, 56)
-
-
57. A processor adjustment system comprising:
-
a processor for processing information; a means for storing test suite instructions for execution by a performance testing component; a means for testing the performance of said processor, wherein said means for testing the performance of said processor determines a high clock signal frequency and power signal voltage level and a low clock signal frequency and power signal voltage level at which said processor begins to produce errors; wherein said means for testing the performance of said processor determines whether the processor is performing a high performance task or a low performance task, said high performance task comprising rendering three dimensional graphics images; and a means for adjusting multiple operating conditions of said processor based upon performance test results of said processor. - View Dependent Claims (58, 59, 60, 61, 62, 63, 64, 65)
-
-
66. A computer system comprising:
-
a memory for storing test suite instructions for execution by a performance testing component; a graphics processing unit for processing information and clocked by a clock signal frequency; a temperature sensor for sensing temperature of said graphics processing unit; a processor management component for controlling adjustments to operating conditions of said graphics processing unit, wherein said adjustments correspond to a combination of enhanced performance, particular application type of task, and reliability maintenance objectives for said graphics processing unit, wherein said task comprises a high performance task comprising rendering three dimensional graphics images; and wherein said performance testing component determines a high clock frequency and voltage and a low clock frequency and voltage at which the processor begins to fail. - View Dependent Claims (67, 68)
-
Specification