Integrated circuit with embedded FeRAM-based RFID
First Claim
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1. An integrated circuit (IC) die comprising:
- a high capacitance solid state circuit region configured to perform predetermined operations;
an RFID block configured for wireless communication with an external source, the RFID block being further configured to generate an internal BIST command in response to an external command received by the RFID block directly through the high capacitance solid state circuit region; and
a built-in self-test (BIST) block coupled to carry out testing of the high capacitance solid state circuit region in response to the internal BIST command,wherein the RFID block is configured to store information relating to the testing,wherein the RFID block is further configured to enable wireless retrieval of the test results from the testing of the high capacitance solid state circuit region.
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Abstract
An integrated circuit (IC) includes a high capacitance solid state circuit region configured to perform predetermined operations, a RFID block comprising a FeRAM block for storing data, and an interface unit configured to transfer to the RFID block an externally-provided unique ID for wirelessly identifying the IC, the unique ID being stored in the FeRAM block. The IC further includes a conductive trace extending through predetermined regions of the IC, the conductive trace being configured as an antenna for the RFID block, wherein the RFID block is configured to receive and transmit information to an external source via the antenna.
34 Citations
9 Claims
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1. An integrated circuit (IC) die comprising:
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a high capacitance solid state circuit region configured to perform predetermined operations; an RFID block configured for wireless communication with an external source, the RFID block being further configured to generate an internal BIST command in response to an external command received by the RFID block directly through the high capacitance solid state circuit region; and a built-in self-test (BIST) block coupled to carry out testing of the high capacitance solid state circuit region in response to the internal BIST command, wherein the RFID block is configured to store information relating to the testing, wherein the RFID block is further configured to enable wireless retrieval of the test results from the testing of the high capacitance solid state circuit region. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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Specification