Non-volatile memory array with resistive sense element block erase and uni-directional write
First Claim
1. An apparatus comprising an array of non-volatile memory cells arranged into a plurality of rows and a plurality of columns, each memory cell in the array comprising a switching device and a resistive sense element (RSE), wherein each of the memory cells in a selected column along a bit line direction are connected to a first control line supplied with a variable voltage and a second control line maintained at a fixed reference voltage, and wherein a plural number of the memory cells in the selected column less than all of the memory cells in the selected column are simultaneously programmed to a first resistive state by lowering the variable voltage of the first control line below the fixed reference voltage of the second control line and flowing respective body-drain currents through the associated switching devices of said plural number of memory cells, a remaining plural number of the memory cells along the selected column remaining at a different, second resistive state.
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Accused Products
Abstract
In accordance with various embodiments, a column of non-volatile memory cells is connected between opposing first and second control lines. A fixed reference voltage is applied to the second control line. The memory cells are simultaneously programmed to a first resistive state by applying a first voltage to the first control line that is greater than the fixed reference voltage. Less than all of the memory cells are subsequently simultaneously programmed to a different, second resistive state by applying a second voltage to the first control line that is less than the fixed reference voltage, so that at the conclusion of the respective programming steps a first portion of the memory cells along said column are at the first resistive state and a second portion of the memory cells along said column are at the second resistive state.
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Citations
18 Claims
- 1. An apparatus comprising an array of non-volatile memory cells arranged into a plurality of rows and a plurality of columns, each memory cell in the array comprising a switching device and a resistive sense element (RSE), wherein each of the memory cells in a selected column along a bit line direction are connected to a first control line supplied with a variable voltage and a second control line maintained at a fixed reference voltage, and wherein a plural number of the memory cells in the selected column less than all of the memory cells in the selected column are simultaneously programmed to a first resistive state by lowering the variable voltage of the first control line below the fixed reference voltage of the second control line and flowing respective body-drain currents through the associated switching devices of said plural number of memory cells, a remaining plural number of the memory cells along the selected column remaining at a different, second resistive state.
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3. A method comprising:
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providing an array of non-volatile memory cells arranged into rows and columns, wherein each of the memory cells comprises a switching device in series with a resistive sense element (RSE), wherein each of the memory cells along a selected column along a bit line direction are connected between first and second control lines, and wherein a fixed reference voltage is continuously applied to the second control line; programming the RSEs of all of the memory cells along the selected column simultaneously to a first resistive state by applying a first voltage to the first control line that is lower than the fixed reference voltage; and subsequently programming a plurality of the RSEs less than all of the memory cells along the selected column simultaneously to a different, second resistive state by applying a second voltage to the first control line that is higher than the fixed reference voltage. - View Dependent Claims (4, 5, 6, 7, 8, 9, 10)
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11. A method comprising:
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connecting a column of non-volatile memory cells along a bit line direction between opposing first and second control lines; applying a fixed reference voltage to the second control line; simultaneously programming the memory cells along said column to a first resistive state by applying a first voltage to the first control line that is greater than the fixed reference voltage; and subsequently simultaneously programming a plurality of the memory cells less than all of the memory cells along said column to a different, second resistive state by applying a second voltage to the first control line that is less than the fixed reference voltage, so that at the conclusion of the respective programming steps a first portion of the memory cells along said column are at the first resistive state and a second portion of the memory cells along said column are at the second resistive state. - View Dependent Claims (12, 13, 14, 15, 16, 17, 18)
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Specification