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Acquiring test data from an electronic circuit

  • US 7,885,781 B2
  • Filed: 07/02/2008
  • Issued: 02/08/2011
  • Est. Priority Date: 01/19/2006
  • Status: Active Grant
First Claim
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1. A system for acquiring test data from an electronic circuit, the system comprising:

  • a probe mounted adjacent to a capture point on the electronic circuit board, the electronic circuit board having an electronic circuit, the probe having a computer processor and a computer memory operatively coupled to the computer processor, the computer memory having disposed within it computer program instructions capable of;

    capturing by the probe an electronic signal of the electronic circuit;

    digitizing by the probe the captured signal;

    transmitting by the probe the digitized signal from the probe through a data communications connection to a remote device; and

    synchronizing acquisition of test data by the probe with acquisition of test data by one or more other probes, including providing from the remote device through the data communications connection to such synchronized probes a synchronization clock signal.

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