Method for measuring a workpiece using a machine tool
First Claim
1. A method for measuring a workpiece on a machine tool comprising the steps of;
- (i) taking a workpiece having a nominal surface profile, said workpiece being located within the working area of a machine tool,(ii) using the machine tool to move an analogue probe having a deflectable stylus along a predetermined measurement path relative to the workpiece,(iii) measuring deflections of the stylus of the analogue probe as said analogue probe moves along said predetermined measurement path,wherein step (ii) comprises moving the analogue probe relative to the workpiece at a speed greater than five millimeters per second and wherein said predetermined measurement path provides intermittent contact between the stylus and the workpiece.
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Accused Products
Abstract
A method is described for measuring a workpiece on a machine tool using an analogue probe having a deflectable stylus. The method comprises the step of taking a workpiece having a nominal surface profile, the workpiece being located within the working area of the machine tool. The machine tool is used to move the analogue probe along a predetermined (known) measurement path relative to the workpiece whilst deflection of the stylus is measured. The analogue probe is moved relative to the workpiece at a speed greater than five millimeters per second and the predetermined measurement path is selected to provide intermittent contact between the stylus and the workpiece.
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Citations
32 Claims
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1. A method for measuring a workpiece on a machine tool comprising the steps of;
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(i) taking a workpiece having a nominal surface profile, said workpiece being located within the working area of a machine tool, (ii) using the machine tool to move an analogue probe having a deflectable stylus along a predetermined measurement path relative to the workpiece, (iii) measuring deflections of the stylus of the analogue probe as said analogue probe moves along said predetermined measurement path, wherein step (ii) comprises moving the analogue probe relative to the workpiece at a speed greater than five millimeters per second and wherein said predetermined measurement path provides intermittent contact between the stylus and the workpiece. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31)
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32. Machine tool apparatus comprising a workpiece holder, an analogue probe having a deflectable stylus, drive means for moving the analogue probe along a predetermined measurement path relative to the workpiece holder, and measurement means for measuring deflections of the stylus of the analogue probe as said probe is moved along said predetermined measurement path, wherein when a workpiece is held by the workpiece holder the drive means is arranged to move the analogue probe along a predetermined measurement path at a speed greater than five millimeters per second, wherein the predetermined measurement path is selected to provide intermittent contact between the stylus and the workpiece.
Specification