Output short circuit and load detection

• US 7,889,011 B2
• Filed: 06/30/2008
• Issued: 02/15/2011
• Est. Priority Date: 06/30/2008
• Status: Active Grant

• Current Assignee: Texas Instruments, Inc.
• Original Assignee: Texas Instruments, Inc.
• Inventors: Krogsgaard, Klaus, Nyboe, Flemming
• Primary Examiner(s): Nguyen; Khanh V
• Application Number:
  US12/165,519
• Publication Number:
  US 20090322426A1
• Time in Patent Office: 960 Days
• Field of Search: 330/207.A, 330/207.P, 330/251, 330/298
• US Class Current: 330/298
• CPC Class Codes: H03F 1/52 Circuit arrangements for protecting such amplifiers monitoring arrangements G01R31/28; increasing reliability in communication systems, e.g. using redundancy H04B1/74
• CPC Class Codes: H03F 3/187 in integrated circuits
• CPC Class Codes: H03F 3/2171 with field-effect devices H03F3/2173 - H03F3/2178 take precedence
• CPC Class Codes: H03F 3/2173 of the bridge type

Abstract

One embodiment of an apparatus for testing an amplifier includes an amplifier having a driver and a filter, the filter being connected between an output of the driver and an output of the amplifier. The filter is operable to produce a demodulated output signal from a higher frequency modulated signal at the driver output. The apparatus also includes a voltage level detector connected to the driver output and a control circuit operable to detect at least one fault based on a voltage level measured at the driver output by the voltage level detector.

Claims

1. An apparatus for testing an amplifier having a first output and a second output, the apparatus comprising:

an upper power supply rail;

a lower power supply rail;

a first driver that is coupled to the upper power supply rail, wherein the first driver includes an output;

a first filter that is coupled between the output of the first driver and a first output of the amplifier, wherein the first filter is operable to produce a demodulated output signal from a higher frequency modulated signal at the output of the first driver;

a first voltage level detector that is coupled to the output of the first driver;

a second driver that is coupled to the upper power supply rail, wherein the second output driver includes an output;

a second filter that is coupled between the output of the second driver and the second output of the amplifier;

a second voltage level detector that is coupled to the output of the second driver;

a pulldown switch that is coupled between the output of the first driver and the lower power supply rail; and

a control circuit operable to detect at least one fault based on a voltage level measured at one or more of the outputs from the first and second drivers by the first and second voltage level detectors.

2. The apparatus of claim 1, wherein the control circuit is operable to test the amplifier when power has been applied to the first driver and before an input signal has been applied to the first driver.

5. The apparatus of claim 1, wherein the apparatus further comprises a resistor that is coupled between the pulldown switch and the lower power supply rail.

6. The apparatus of claim 1, wherein the pulldown switch further comprises a transistor that is coupled to the control circuit at its gate, wherein the control circuit is operable to turn on the transistor to pull the driver output down to the lower power supply rail and to determine whether the driver output is held above a reference voltage level by a short to the upper power supply rail.

7. The apparatus of claim 1, wherein the first voltage level detector further comprises a comparator having a first input that is coupled to the output of the first driver, a second input that is coupled to a reference voltage source, and an output that is coupled to the control circuit.

8. The apparatus of claim 1, wherein the control circuit is operable to disable the amplifier if the at least one fault is detected.

9. The apparatus of claim 1, wherein the first driver further comprises a plurality of transistors coupled in series with one another between the upper and lower power supply rails, and wherein the output of the first driver further comprises a node between the plurality of transistors.

3. The apparatus of claim l, wherein the apparatus further comprises:

a first gate driver that is coupled to a control input of the first driver; and

a second gate driver that is coupled to a control input of the second driver, wherein the control circuit is operable to test the amplifier when power has been applied to the first gate driver and before an input signal has been applied to the first driver.

4. The apparatus of claim 3, wherein the control circuit is operable to detect whether a short to the lower power supply rail prevents the first voltage level at the first driver output from rising due to the power applied to the first gate driver.

10. A method of testing an amplifier, the method comprising:

applying power to a first gate driver in a class D amplifier;

measuring a first voltage level at a first test node at an output of an output stage driver and an input of a first output filter;

determining a presence of at least one type of fault associated with the class D amplifier based at least in part on the first voltage level measured at the first test node;

pulling a second test node at an output of a second gate driver down to a lower power supply rail, wherein the second test node is coupled to a second output filter so that the first and second output filters are coupled together in an H bridge; and

determining whether a voltage level at the second test node falls below a reference voltage.

11. The method of claim 10, wherein the steps of measuring the first voltage level and determining the presence are performed without an input signal applied to the output stage driver.

12. The method of claim 10, wherein the method further comprises disabling the class D amplifier if the presence of at least one type of fault is detected.

13. The method of claim 10, wherein the step of determining the presence further comprises identifying whether a short to the lower power supply rail exists and prevents the first voltage level at the first test node from being pulled above the reference voltage by the first gate driver.

14. The method of claim 10, wherein the method further comprises pulling the first test node down toward a lower power supply rail, and wherein the step of determining the presence further comprises identifying whether a short to an upper power supply rail exists and prevents the first voltage level at the first test node from being pulled below the reference voltage.

15. An apparatus comprising:

an amplifier having a first driver and a first filter, wherein the first filter is coupled between a first output of the first driver and a first output of the amplifier, and wherein the first filter is operable to produce a demodulated a first output signal from a higher frequency modulated signal at the first driver output;

a first voltage level comparator having a first input and a second input, wherein the first input of the first voltage level comparator is coupled to the first driver output, and wherein the second input of the first voltage level comparator is coupled to a reference voltage source;

a gate driver coupled to a control input of the first driver;

a control circuit operable to detect at least one fault based on a voltage level measured at the first driver output by the voltage level comparator;

a pulldown switch coupled between the first driver output and a lower power supply rail, wherein the pulldown switch includes a transistor having a gate coupled to the control circuit;

a resistor coupled between the pulldown switch and the lower power supply rail;

a second driver and second filter, wherein the second filter is coupled between an output of the second driver and a second output of the amplifier; and

a second voltage level comparator coupled to the output of the second driver, wherein the control circuit is operable to detect a load coupled between the first amplifier output and the second output of the amplifier by turning on the pulldown switch and measuring a voltage level on at least one of the first driver output and second driver output.