Method and apparatus for storing failing part locations in a module
First Claim
Patent Images
1. A memory module, comprising:
- a memory module carrier substrate;
a plurality of device locations on the memory module carrier substrate, each device location configured for disposition and replacement of a discrete memory device;
a plurality of discrete memory devices, each discrete memory device disposed at one of the plurality of device locations; and
at least one discrete non-volatile storage device disposed on the memory module carrier substrate and configured for storing information indicating a failure status of each of the discrete memory devices at each of the plurality of device locations.
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Abstract
A non-volatile storage device on a memory module comprising a plurality of memory devices is used to store the locations of defective parts on the memory module, such as data query (“DQ”) terminals, identified during a testing procedure. After testing, the non-volatile storage device, such as an electrically erasable programmable read only memory (“EEPROM”), may be accessed to determine specific memory devices such as dynamic random access memory (“DRAM”) which need to be repaired or replaced rather than re-testing the specific memory module.
127 Citations
17 Claims
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1. A memory module, comprising:
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a memory module carrier substrate; a plurality of device locations on the memory module carrier substrate, each device location configured for disposition and replacement of a discrete memory device; a plurality of discrete memory devices, each discrete memory device disposed at one of the plurality of device locations; and at least one discrete non-volatile storage device disposed on the memory module carrier substrate and configured for storing information indicating a failure status of each of the discrete memory devices at each of the plurality of device locations. - View Dependent Claims (2, 3, 4, 5)
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6. A method of testing a memory module, comprising:
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testing a memory module including a memory module carrier substrate with a plurality of device locations and a plurality of discrete memory devices, each discrete memory device disposed at one of the plurality of device locations; defining information for each device location of the plurality, the information indicative of a failure status for the discrete memory device disposed at that device location; storing the information in at least one discrete non-volatile storage device disposed on the memory module; accessing the information and identifying a failing device location of at least one failing discrete memory device; physically removing the at least one failing discrete memory device; and disposing a replacement memory device at the device location of the at least one failing discrete memory device. - View Dependent Claims (7, 8)
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9. A method of fabricating a memory module, the method comprising:
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disposing a plurality of discrete memory devices at a plurality of device locations on a memory module carrier substrate; testing at least one aspect of each of the plurality of discrete memory devices; storing information indicative of at least one device location of at least one failing discrete memory device of the plurality of discrete memory devices; subsequently accessing the stored information; removing the at least one failing discrete memory device indicated by the stored information; and disposing at least one substitute discrete memory device at the device location of the at least one failing discrete memory device. - View Dependent Claims (10, 11, 12)
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13. A computer system, comprising:
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a processor; and a memory module operably coupled to the processor and comprising; a memory module substrate including a plurality of device locations, each device location configured for disposition of a discrete memory device and further configured for replacement of the discrete memory device; a plurality of discrete memory devices, each discrete memory device disposed at one of the plurality of device locations; and at least one discrete non-volatile storage device disposed on a memory module carrier substrate and configured for storing information indicating a failure status of each of the discrete memory devices at each of the plurality of device locations. - View Dependent Claims (14, 15, 16, 17)
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Specification