Configurable pattern detection method and apparatus

• US 7,890,923 B2
• Filed: 12/01/2006
• Issued: 02/15/2011
• Est. Priority Date: 12/01/2006
• Status: Expired due to Fees

• Current Assignee: International Business Machines Corporation
• Original Assignee: International Business Machines Corporation
• Inventors: Elaasar, Maged E.
• Primary Examiner(s): Pham; Thomas K
• Application Number:
  US11/565,700
• Publication Number:
  US 20080134135A1
• Time in Patent Office: 1,537 Days
• Field of Search: 717/121, 717/131, 717/104
• US Class Current: 717/104
• CPC Class Codes: G06F 8/75 Structural analysis for program understanding

Abstract

Computer apparatus and method for detecting patterns in structured models, obtains a pattern specification of a subject pattern. The pattern specification (a) defines the subject pattern as a meta-class in a target domain, and (b) specifies one or more pattern roles as meta-properties of the subject pattern. Using the pattern specification, the pattern detector navigates user models, each user model having respective model elements. Through said navigating, the pattern detector looks for structures of model elements that fulfill the pattern roles. The pattern detector indicates conforming pattern instances as detected instances of the subject pattern.

Claims

1. A computer method for detecting patterns in structured models, comprising the steps of:

using a digital processor, obtaining a pattern specification of a subject pattern, the pattern specification (a) defining the subject pattern as a meta-class in a target domain instead of as a meta model, and (b) specifying one or more pattern roles as meta-properties of the subject pattern; and

in processor memory configured to select patterns in structured models, using the pattern specification, navigating user models, each user model having respective model elements, said navigating including looking for structures of model elements that fulfill the pattern roles, and returning conforming pattern instances as detected instances of the subject pattern.

2. A method as claimed in claim 1 further comprising the step of deriving a pattern detection sequence from the pattern specification.

3. A method as claimed in claim 2 wherein the pattern specification specifies certain ordering which influences flow control of the pattern detection sequence.

4. A method as claimed in claim 2 wherein the pattern detection sequence is customized by certain semantics specified in the pattern specification.

5. A method as claimed in claim 1 wherein the target domain is a computer programming model;

and

the pattern meta-class is a meta-class in an object oriented model.

6. A method as claimed in claim 1 wherein the subject pattern is any of a desired pattern and an anti-pattern.

7. A method as claimed in claim 1 wherein the target domain is a UML2 structure.

8. Computer apparatus for detecting patterns in a structured model, comprising:

a digital processor having a pattern specification of a subject pattern, the pattern specification (a) defining the subject pattern as a meta-class in a target domain instead of as a meta model, and (b) specifying one or more pattern roles as meta-properties of the subject pattern; and

a detector operatively coupled to the digital processor and configured to automatically detect patterns in a structured model, given one or more user models, each user model having respective model elements, the detector using the pattern specification and navigating the user models looking for structures of model elements that fulfill the pattern roles, the detector indicating on output conforming pattern instances as detected instances of the subject pattern.

9. Computer apparatus as claimed in claim 8 wherein the detector derives a pattern detection sequence from the pattern specification.

10. Computer apparatus as claimed in claim 9 wherein the pattern specification specifies certain ordering which influences flow control of the pattern detection sequence.

11. Computer apparatus as claimed in claim 9 wherein the pattern detection sequence is customized by certain semantics specified in the pattern specification.

12. Computer apparatus as claimed in claim 8 wherein the target domain is a computer programming model;

and

the pattern meta-class is a meta-class in an object oriented model.

13. Computer apparatus as claimed in claim 8 wherein the subject pattern is any of a desired pattern and an anti-pattern.

14. Computer apparatus as claimed in claim 8 wherein the subject pattern inherits structure of a relatively abstract pattern.

15. Computer apparatus as claimed in claim 8 wherein the target domain is a UML2 structure.

16. A pattern detector for detecting patterns in a structured model comprising:

in a digital processor;

means for specifying a subject pattern, the specification means (a) defining the subject pattern as a meta-class in a target domain instead of as a meta model, and (b) specifying one or more pattern roles as meta-properties of the subject pattern;

given one or more user models, each user model having respective model elements, detector means for using the pattern specification and navigating the user models looking for structures of model elements that fulfill the pattern roles, the detector means indicating conforming pattern instances as detected instances of the subject pattern.

17. A pattern detector as claimed in claim 16 further comprising derivation means for deriving a pattern detection sequence from the pattern specification.

18. A pattern detector as claimed in claim 17 wherein the pattern specification specifies certain ordering which influences flow control of the pattern detection sequence.

19. A pattern detector as claimed in claim 17 wherein the pattern detection sequence is customized by certain semantics specified in the pattern specification.

20. A pattern detector as claimed in claim 16 wherein the target domain is a computer programming model;

and

the pattern meta-class is a meta-class in an object oriented model.

21. A pattern detector as claimed in claim 16 wherein the subject pattern is any of a desired pattern and an anti-pattern.

22. A pattern detector as claimed in claim 16 wherein the subject pattern inherits structure of a relatively abstract pattern.

23. A computer program product comprising:

a computer readable storage medium having computer usable program code for pattern detection in a meta-model environment, said computer program product including;

computer usable program code for generating a pattern specification of a subject pattern, the pattern specification (a) defining the subject pattern as a meta-class in a target domain instead of as a meta model, and (b) specifying one or more pattern roles as meta-properties of the subject pattern;

computer usable program code for deriving a pattern detection sequence from the pattern specification;

computer usable program code for applying the derived pattern detection sequence to user models, each user model having respective model elements, said applying including navigating a user model looking for structures of model elements that fulfill the pattern roles and outputting conforming pattern instances as detected instances of the subject pattern.

24. A computer program product as claimed in claim 23 wherein the pattern specification specifies certain ordering which influences flow control of the pattern detection sequence.

25. A computer program product as claimed in claim 23 wherein the pattern detection sequence is customized by certain semantics specified in the pattern specification.

26. A computer program product as claimed in claim 23 wherein the subject pattern is any of a desired pattern and an anti-pattern.