Semiconductor device including MISFET having internal stress film
DCFirst Claim
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1. A semiconductor device, comprising a MISFET, whereinthe MISFET includes:
- an active region made of a semiconductor substrate;
a gate insulating film formed on the active region;
a gate electrode formed on the gate insulating film;
source/drain regions formed in regions of the active region located on both sides of the gate electrode; and
a silicon nitride film formed over from side surfaces of the gate electrode to upper surfaces of the source/drain regions, wherein;
the silicon nitride film is not formed on an upper surface of the gate electrode, andthe gate electrode protrudes upward from a surface level of parts of the silicon nitride film located at both side surfaces of the gate electrode.
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Abstract
A semiconductor device includes a first-type internal stress film formed of a silicon oxide film over source/drain regions of an nMISFET and a second-type internal stress film formed of a TEOS film over source/drain regions of a pMISFET. In a channel region of the nMISFET, a tensile stress is generated in the direction of movement of electrons due to the first-type internal stress film, so that the mobility of electrons is increased. In a channel region of the pMISFET, a compressive stress is generated in the direction of movement of holes due to the second-type internal stress film, so that the mobility of holes is increased.
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25 Claims
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1. A semiconductor device, comprising a MISFET, wherein
the MISFET includes: -
an active region made of a semiconductor substrate; a gate insulating film formed on the active region; a gate electrode formed on the gate insulating film; source/drain regions formed in regions of the active region located on both sides of the gate electrode; and a silicon nitride film formed over from side surfaces of the gate electrode to upper surfaces of the source/drain regions, wherein; the silicon nitride film is not formed on an upper surface of the gate electrode, and the gate electrode protrudes upward from a surface level of parts of the silicon nitride film located at both side surfaces of the gate electrode. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25)
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Specification