Method and apparatus for dynamic threshold voltage control of MOS transistors in dynamic logic circuits

• US 7,898,297 B2
• Filed: 03/09/2007
• Issued: 03/01/2011
• Est. Priority Date: 01/04/2005
• Status: Expired due to Fees

• Current Assignee: Semi Solutions LLC
• Original Assignee: Semi Solutions LLC
• Inventors: Kapoor, Ashok Kumar, Strain, Robert, Marko, Reuven
• Primary Examiner(s): Cho, James H.
• Assistant Examiner(s): CRAWFORD, JASON
• Application Number:
  US11/684,466
• Publication Number:
  US 20070229145A1
• Time in Patent Office: 1,453 Days
• Field of Search: 326 93- 98, 327/534
• US Class Current: 326/98
• CPC Class Codes: H01L 21/823807 with a particular manufacturing method of the channel structures, e.g. channel implants, halo or pocket implants, or channel materials
• CPC Class Codes: H01L 27/0727 in combination with diodes, or capacitors or resistors
• CPC Class Codes: H01L 27/0921 Means for preventing a bipolar, e.g. thyristor, action between the different transistor regions, e.g. Latchup prevention
• CPC Class Codes: H03K 19/0963 using transistors of complementary type H03K19/0966 takes precedence

Abstract

Metal-oxide semiconductor (MOS) transistors that are operable at voltages below 1.5V, that are area efficient, and that exhibit improved drive strength and leakage current that are disclosed. A dynamic threshold voltage control scheme is used that does not require a change to existing MOS technology processes. Threshold voltage of the transistor is controlled, such that in the Off state, the threshold voltage of the transistor is set high, keeping the transistor leakage to a small value. The advantages provided by apply to dynamic logic, as well as in the specific well separation imposed by design rules because well potential difference are lower than the supply voltage swing.

Claims

1. A dynamic logic circuit, comprising:

a PMOS transistor for precharging a node during a precharge phase controlled by a precharge phase signal;

a first NMOS transistor for floating a circuit during said precharge phase;

a plurality of additional NMOS transistors connected between a source terminal of said PMOS transistor and a source terminal of said first NMOS transistor, said plurality of additional NMOS transistors performing a logic function during an evaluation phase of said dynamic logic circuit; and

an adaptive threshold voltage control circuit connected between a gate terminal and a transistor substrate terminal of said PMOS transistor;

said adaptive voltage control circuit comprising any of a forward biased junction diode formed in an isolated structure, a capacitor, and a forward biased junction diode formed in an isolated structure connected in parallel with a capacitor.

2. The dynamic logic circuit of claim 1, further comprising:

a precharge circuit connected to a first node of said plurality of additional NMOS transistors, said precharge circuit connecting a source terminal to a drain terminal of two NMOS transistors that are connected in series with said plurality of additional NMOS transistors, said precharge circuit comprising of one or more junction diodes, the cathode of a last junction diode of said one or more junction diodes being connected to said first node, and an anode of a first diode being connected to receive a control signal comprising an inverted signal of said precharge phase control signal.

3. The dynamic logic circuit of claim 1, wherein at least two NMOS transistors of said plurality of additional NMOS transistors are connected in a NAND configuration.

4. The dynamic logic circuit of claim 1, wherein at least two NMOS transistors of said plurality of additional NMOS transistors are connected in a NOR configuration.

5. A dynamic logic circuit, comprising:

a PMOS transistor for precharging a node during a precharge phase;

a first NMOS transistor for floating a circuit during said precharge phase;

a plurality of additional NMOS transistors connected between a source terminal of said PMOS transistor and a source terminal of said first NMOS transistor, said plurality of additional NMOS transistors performing a logic function during an evaluation phase; and

a precharge circuit connected to a first node of said plurality of additional NMOS transistors to connect a source terminal to a drain terminal of two NMOS transistors which are connected in series with said plurality of additional NMOS transistors;

said precharge circuit comprising of one or more junction diodes, the cathode of a last diode of said one or more junction diodes being connected to said node, and an anode of a first diode of said one or more junction diodes being connected to receive a control signal comprising an inverted signal of a precharge phase control signal.

6. The dynamic logic circuit of claim 5, wherein at least two NMOS transistors of said plurality of additional NMOS transistors are connected in a NAND configuration.

7. The dynamic logic circuit of claim 5, wherein at least two NMOS transistors of said plurality of additional NMOS transistors are connected in NOR configuration.