Spectrometer designs

• US 7,898,660 B2
• Filed: 01/29/2008
• Issued: 03/01/2011
• Est. Priority Date: 05/27/2005
• Status: Active Grant

• Current Assignee: Corning Incorporated
• Original Assignee: Innovative Technical Solutions, Inc. (Corning Incorporated)
• Inventors: Warren, Chris P.
• Primary Examiner(s): STAFIRA, MICHAEL PATRICK
• Application Number:
  US12/022,054
• Publication Number:
  US 20080239492A1
• Time in Patent Office: 1,127 Days
• Field of Search: 356300-338
• US Class Current: 356/328
• CPC Class Codes: G01J 3/02 Details
• CPC Class Codes: G01J 3/0205 Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
• CPC Class Codes: G01J 3/0208 using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
• CPC Class Codes: G01J 3/0259 Monolithic
• CPC Class Codes: G01J 3/0291 Housings; Spectrometer accessories; Spatial arrangement of elements, e.g. folded path arrangements
• CPC Class Codes: G01J 3/18 using diffraction elements, e.g. grating gratings per se G02B
• CPC Class Codes: G01J 3/2823 Imaging spectrometer

Abstract

Various embodiments include spectrometers comprising diffraction gratings monolithically integrated with other optical elements. These optical elements may include slits and mirrors. The mirrors and gratings may be curved. In one embodiment, the mirrors are concave and the grating is convex. The mirrors and grating may be concentric or nearly concentric.

Claims

1. A monolithic imaging spectrometer comprising:

a body comprising a mass of substantially optically transmissive material;

a slit disposed on said mass of substantially optically transmissive material;

a first concave reflector, said first reflector and said slit defining a first optical path therebetween, such that the first optical path comprises said substantially optically transmissive material;

a curved reflective grating, said first reflector and said curved reflective grating defining a second optical path therebetween, said first reflector and said reflective grating disposed with respect to said body such that said second optical path substantially comprises said substantially transmissive material; and

a second concave reflector disposed such that light diffracted from said curved reflective grating is reflected from said second reflector onto an imaging detector array;

wherein the slit, the first reflector, the second reflector and the curved reflective grating are integrated with the body in a monolithic assembly,

wherein the first reflector is disposed on a first convex portion of said body,

wherein the second reflector is disposed on a second convex portion of said body, and

wherein the reflective grating is convex and is disposed on a concave portion of said body.

2. The spectrometer of claim 1, wherein said first reflector has a curvature defined by a first sphere having a first radius, said second reflector has a curvature defined by a second sphere having a second radius, and said reflective grating has a curvature defined by a third sphere having a third radius.

3. The spectrometer of claim 1, wherein the first reflector has a curvature defined by a first radius of curvature and the reflective grating has a curvature defined by a third radius of curvature and wherein the third radius of curvature is about half the first radius of curvature.

4. The spectrometer of claim 1, wherein the second reflector has a curvature defined by a second radius of curvature and the reflective grating has a curvature defined by a third radius of curvature and wherein the third radius of curvature is about half the second radius of curvature.

5. The spectrometer of claim 1, wherein the first reflector has a first radius of curvature, the second reflector has a second radius of curvature and the reflective grating has a third radius of curvature and wherein said third radius of curvature is about half the first and second radii of curvature.

6. The spectrometer of claim 1, wherein the spectrometer is configured to operate within the wavelength range of approximately 400 nm to approximately 1000 nm.

7. The spectrometer of claim 1, wherein the monolithic spectrometer is configured to operate within the range of approximately 900 nm to approximately 2500 nm.

8. The spectrometer of claim 1, wherein the monolithic spectrometer is configured to operate within the range of approximately 3 μ

m to approximately 5 μ

m.

9. The spectrometer of claim 1, wherein the monolithic spectrometer is configured to operate within the range of approximately 8 μ

m to approximately 12 μ

m.

10. The spectrometer of claim 1, wherein said substantially transmissive material comprises fused silica.

11. The spectrometer of claim 1, wherein said body has a width between about 5 centimeters and 10 centimeters.

12. The spectrometer of claim 1, further comprising the imaging detector array, said imaging detector array comprising a two-dimensional CMOS detector array, a two-dimensional CCD detector array, a two-dimensional HgCdTe detector array, or a two-dimensional InSb detector array.

13. The spectrometer of claim 1, further comprising a sensor sensitive to IR radiation.

36. The spectrometer of claim 1, wherein the first reflector, the second reflector and the reflective grating are spherical.

37. The spectrometer of claim 1, wherein the first reflector, the second reflector and the reflective grating are configured to provide unity magnification.

38. The spectrometer of claim 1, wherein the curvatures of the first reflector, the second reflector and the reflective grating are configured to correct the image for astigmatism and/or field curvature by compensating optical aberrations introduced by one another.

39. The spectrometer of claim 1, wherein the spectrometer has a spectral resolution of less than about 5 nanometers.

14. A monolithic imaging spectrometer comprising:

a body comprising a mass of substantially optically transmissive material;

a first curved reflector, said first reflector being concave;

a second curved reflector, said second reflector being concave; and

a curved reflective grating, said reflective grating being convex,

wherein said first curved reflector and said reflective grating define a first optical path therebetween and said first curved reflector and said reflective grating are disposed with respect to said body such that said first optical path substantially comprises said substantially transmissive material,

wherein said first curved reflector and said second curved reflector are disposed on convex portions of said body and said reflective grating is disposed on a concave surface of said body,

wherein said reflective grating is configured to reflect broadband light having a bandwidth of at least about 200 nanometers to the second curved reflector via a second optical path comprising said substantially transmissive material, wherein the broadband light is reflected from the second curved reflector onto an imaging detector array, and

wherein said body is substantially optically transmissive for wavelengths in the visible region.

15. The spectrometer of claim 14, wherein said first reflector has a curvature defined by a first sphere having a first radius, said second reflector has a curvature defined by a second sphere having a second radius, and said reflective grating has a curvature defined by a third sphere having a third radius.

16. The spectrometer of claim 14, wherein the first reflector has a curvature defined by a first radius of curvature and the reflective grating has a curvature defined by a third radius of curvature and wherein the third radius of curvature is about half the first radius of curvature.

17. The spectrometer of claim 14, wherein the second reflector has a curvature defined by a second radius of curvature and the reflective grating has a curvature defined by a third radius of curvature and wherein the third radius of curvature is about half the second radius of curvature.

18. The spectrometer of claim 14, wherein the first reflector has a first radius of curvature, the second reflector has a second radius of curvature and the reflective grating has a third radius of curvature and wherein said third radius of curvature is about half the first and second radii of curvature.

19. The spectrometer of claim 14, further comprising a sensor sensitive to visible radiation.

20. The spectrometer of claim 14, wherein the reflective grating is configured to reflect a broadband light having a bandwidth of at least about 400 nanometers.

21. The spectrometer of claim 14, further comprising a slit, light passing through said slit propagating to said first curved reflector and along said first optical path to said grating.

22. A monolithic imaging spectrometer comprising:

a housing;

a medium comprising substantially optically transmissive material;

a first curved reflector, said first reflector being concave;

a second curved reflector, said second reflector being concave;

a concave surface on said medium; and

a convex reflective grating disposed on said concave surface, said first curved reflector and said reflective grating defining a first optical path therebetween, said first curved reflector and said reflective grating disposed with respect to each other and said medium such that said first optical path substantially comprises said substantially transmissive material,

wherein said second curved reflector is configured to reflect light diffracted from said reflective grating onto an imaging detector array,

wherein the first and second reflectors are disposed on curved portions of said substantially transmissive material that are convex, and

wherein the size of the housing is no greater than 1000 cubic centimeters.

23. The spectrometer of claim 22, wherein said first reflector has a curvature defined by a first sphere having a first radius, said second reflector has a curvature defined by a second sphere having a second radius, and said reflective grating has a curvature defined by a third sphere having a third radius.

24. The spectrometer of claim 22, wherein the first reflector has a curvature defined by a first radius of curvature and the reflective grating has a curvature defined by a third radius of curvature and wherein the third radius of curvature is about half the first radius of curvature.

25. The spectrometer of claim 22, wherein the second reflector has a curvature defined by a second radius of curvature and the reflective grating has a curvature defined by a third radius of curvature and wherein the third radius of curvature is about half the second radius of curvature.

26. The spectrometer of claim 22, wherein the first reflector has a first radius of curvature, the second reflector has a second radius of curvature and the reflective grating has a third radius of curvature and wherein said third radius of curvature is about half the first and second radii of curvature.

27. The spectrometer of claim 22, further comprising a slit disposed such that light propagating though said slit is reflected from said first reflector to said reflective grating.

29. The spectrometer of claim 22, wherein the monolithic spectrometer is configured to operate within the range of approximately 400 nm to approximately 1000 nm.

30. The spectrometer of claim 22, wherein the monolithic spectrometer is configured to operate within the range of approximately 900 nm to approximately 2500 nm.

31. The spectrometer of claim 22, wherein the monolithic spectrometer is configured to operate within the range of approximately 3 μ

m to approximately 5 μ

m.

32. The spectrometer of claim 22, wherein the imaging monolithic spectrometer is configured to operate within the range of approximately 8 μ

m to approximately 12 μ

m.

33. The spectrometer of claim 22, wherein the imaging detector comprises a sensor sensitive to IR radiation.

34. The spectrometer of claim 22, wherein the spectrometer weighs less than 2 pounds.

28. The spectrometer of 22, further comprising the imaging detector array, said imaging detector array disposed in a second optical path extending from said reflective grating to said detector, said second optical path substantially comprising said substantially transmissive material.

35. A monolithic imaging spectrometer comprising:

a body comprising a mass of substantially optically transmissive material;

a first curved reflector, said first reflector being concave and having a radius of curvature;

a second curved reflector, said second reflector being concave and having a radius of curvature; and

a curved reflective grating, said reflective grating being convex and having a radius of curvature,

wherein said first curved reflector and said reflective grating define a first optical path therebetween and said first curved reflector and said reflective grating are disposed with respect to said body such that said first optical path substantially comprises said substantially transmissive material,

wherein said first curved reflector and said second curved reflector are disposed on convex portions of said body and said reflective grating is disposed on a concave surface of said body, and

wherein the radius of curvature of said curved reflective grating is substantially half the radii of curvatures of said first and second curved reflectors.

40. The spectrometer of claim 35, further comprising an imaging detector array.