Uncorrectable error detection utilizing complementary test patterns
First Claim
1. A method for utilizing error correction code (ECC) logic that detects and corrects correctable errors to detect multi-bit errors, said method comprising:
- applying a first test pattern and a second test pattern to a set of hardware bit positions, wherein the second test pattern is the logical complement of the first test pattern, wherein the first and second test patterns are utilized by said ECC logic to detect correctable errors having n or fewer bits;
determining one or more bit positions of a first correctable error occurring responsive to applying the first test pattern;
determining one or more bit positions of a second correctable error occurring responsive to applying the second test pattern, wherein one or more of the bit positions of the second correctable error are different than the bit positions of the first correctable error;
processing the determined bit positions of the first and second correctable errors to identify a multiple-bit error within the set of hardware bit positions; and
in response to detecting a multiple-bit error within the set of hardware bit positions resulting from the processing of the determined bit positions of the first and second correctable errors, recording an uncorrectable error record entry, wherein said uncorrectable error record entry includes;
the bit positions of the first and second correctable errors; and
the count and frequency of occurrence of each of the first and second correctable errors.
1 Assignment
0 Petitions
Accused Products
Abstract
A system, method and program product for utilizing error correction code (ECC) logic to detect multi-bit errors. In one embodiment, a first test pattern and a second test pattern are applied to a set of hardware bit positions. The first and second patterns are multiple logic level patterns and the second test pattern is the logical complement of the first test pattern. The first and second test patterns are utilized by the ECC logic to detect correctable errors having n or fewer bits. One or more bit positions of a first correctable error occurring responsive to applying the first test pattern are determined and one or more bit positions of a second correctable error occurring responsive to applying the second test pattern are determined. The determined bit positions of the first and second correctable errors are processed to identify a multiple-bit error within the set of hardware bit positions.
-
Citations
18 Claims
-
1. A method for utilizing error correction code (ECC) logic that detects and corrects correctable errors to detect multi-bit errors, said method comprising:
-
applying a first test pattern and a second test pattern to a set of hardware bit positions, wherein the second test pattern is the logical complement of the first test pattern, wherein the first and second test patterns are utilized by said ECC logic to detect correctable errors having n or fewer bits; determining one or more bit positions of a first correctable error occurring responsive to applying the first test pattern; determining one or more bit positions of a second correctable error occurring responsive to applying the second test pattern, wherein one or more of the bit positions of the second correctable error are different than the bit positions of the first correctable error; processing the determined bit positions of the first and second correctable errors to identify a multiple-bit error within the set of hardware bit positions; and in response to detecting a multiple-bit error within the set of hardware bit positions resulting from the processing of the determined bit positions of the first and second correctable errors, recording an uncorrectable error record entry, wherein said uncorrectable error record entry includes; the bit positions of the first and second correctable errors; and the count and frequency of occurrence of each of the first and second correctable errors. - View Dependent Claims (2, 3, 4, 5, 6)
-
-
7. A system for utilizing error correction code (ECC) logic that detects and corrects correctable errors to detect multi-bit errors, said system comprising:
-
an ECC logic module that applies a first test pattern and a second test pattern to a set of hardware bit positions, wherein the second test pattern is the logical complement of the first test pattern, wherein the first and second test patterns are utilized by said ECC logic to detect correctable errors having n or fewer bits; an error detection unit that determines one or more bit positions of a first correctable error occurring responsive to applying the first test pattern, said error detection unit determining one or more bit positions of a second correctable error occurring responsive to applying the second test pattern, wherein one or more of the bit positions of the second correctable error are different than the bit positions of the first correctable error; uncorrectable error storage; and an uncorrectable error unit that processes the determined bit positions of the first and second correctable errors to identify a multiple-bit error within the set of hardware bit positions and that, responsive to detection of the multiple-bit error within the set of hardware bit positions, records an uncorrectable error record entry in the uncorrectable error storage, wherein said uncorrectable error record entry includes; the bit positions of the first and second correctable errors; and the count and frequency of occurrence of each of the first and second correctable errors. - View Dependent Claims (8, 9, 10, 11, 12)
-
-
13. A computer-readable data storage medium having encoded thereon computer-executable instructions for utilizing error correction code (ECC) logic that detects and corrects correctable errors to detect multi-bit errors, said computer-executable instructions adapted to cause a computer to perform:
-
applying a first test pattern and a second test pattern to a set of hardware bit positions, wherein the second test pattern is the logical complement of the first test pattern, wherein the first and second test patterns are utilized by said ECC logic to detect correctable errors having n or fewer bits; determining one or more bit positions of a first correctable error occurring responsive to applying the first test pattern; determining one or more bit positions of a second correctable error occurring responsive to applying the second test pattern, wherein one or more of the bit positions of the second correctable error are different than the bit positions of the first correctable error; processing the determined bit positions of the first and second correctable errors to identify a multiple-bit error within the set of hardware bit positions; and in response to detecting a multiple-bit error within the set of hardware bit positions resulting from the processing of the determined bit positions of the first and second correctable errors, recording an uncorrectable error record entry, wherein said uncorrectable error record entry includes; the bit positions of the first and second correctable errors; and the count and frequency of occurrence of each of the first and second correctable errors. - View Dependent Claims (14, 15, 16, 17, 18)
-
Specification