Methods and apparatus for data analysis
First Claim
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1. A semiconductor test data analysis system for identifying outliers in semiconductor test data, comprising:
- a memory configured to store the test data; and
a processor connected to the memory, wherein the processor is configured to;
retrieve the test data from memory;
compare the test data to an upper outlier threshold and a lower outlier threshold, wherein the upper outlier threshold and the lower outlier threshold are derived from a median of a frequency distribution of the test data; and
determine whether the test data include outliers according to the comparison of the test data to the upper outlier threshold and the lower outlier threshold.
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Abstract
Methods and apparatus for data analysis according to various aspects of the present invention identify statistical outliers in data, such as test data for components. The outliers may be identified and categorized according to the distribution of the data. In addition, outliers may be identified according to multiple parameters, such as spatial relationships, variations in the test data, and correlations to other test data.
35 Citations
21 Claims
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1. A semiconductor test data analysis system for identifying outliers in semiconductor test data, comprising:
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a memory configured to store the test data; and a processor connected to the memory, wherein the processor is configured to; retrieve the test data from memory; compare the test data to an upper outlier threshold and a lower outlier threshold, wherein the upper outlier threshold and the lower outlier threshold are derived from a median of a frequency distribution of the test data; and determine whether the test data include outliers according to the comparison of the test data to the upper outlier threshold and the lower outlier threshold. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A non-transitory computer readable medium containing computer instructions stored therein for causing a computer processor to perform a method of identifying outliers in semiconductor test data, comprising:
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establishing an upper outlier threshold and a lower outlier threshold according to the test data, wherein the upper outlier threshold and the lower outlier threshold are derived from a median of a frequency distribution of the test data; comparing the test data to the upper outlier threshold and the lower outlier threshold; and identifying outliers in the test data according to the comparison of the test data to the upper outlier threshold and the lower outlier threshold. - View Dependent Claims (9, 10, 11, 12, 13, 14)
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15. A medium storing instructions for causing a computer to execute a process, wherein the process comprises:
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retrieving a set of semiconductor test data from a memory; establishing an upper outlier threshold and a lower outlier threshold, wherein the upper outlier threshold and the lower outlier threshold are derived from a median of a frequency distribution of the test data; comparing the test data to the upper outlier threshold and the lower outlier threshold; and determining whether the test data include outliers according to the comparison of the test data to the upper outlier threshold and the lower outlier threshold. - View Dependent Claims (16, 17, 18, 19, 20, 21)
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Specification