CMOS circuit leakage current calculator
First Claim
1. A method performed in a data processing system for determining leakage current in a CMOS circuit having a plurality of devices comprising the steps of:
- reading netlist data from a data processing system memory containing information on each of the plurality of devices and their respective connections within the circuit;
reading a plurality of input state data from said data processing system memory, each input state specifying input signals provided to the circuit;
determining which devices in the circuit are in an OFF state for each of the plurality of input states;
computing leakage current for only those devices that are in the OFF state and do not have the same source and drain voltage; and
providing to a data processing system display resulting leakage information for each input state.
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Accused Products
Abstract
This invention provides a method for determining leakage current in a CMOS circuit having several devices. It includes the steps of reading a netlist which describes the circuit and includes information on both these devices in the circuit and how these devices are interconnected. Next, an input signal state data file is generated which provides all of the possible input states for the circuit. A determination is made of which devices in the circuit are in an OFF state for each of the input signal states provided. Then the leakage current for each of these devices in the OFF state is computed for each of the input signal states.
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Citations
18 Claims
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1. A method performed in a data processing system for determining leakage current in a CMOS circuit having a plurality of devices comprising the steps of:
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reading netlist data from a data processing system memory containing information on each of the plurality of devices and their respective connections within the circuit; reading a plurality of input state data from said data processing system memory, each input state specifying input signals provided to the circuit; determining which devices in the circuit are in an OFF state for each of the plurality of input states; computing leakage current for only those devices that are in the OFF state and do not have the same source and drain voltage; and providing to a data processing system display resulting leakage information for each input state. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A method performed in a data processing system for determining leakage current in a CMOS circuit having a plurality of devices comprising the steps of:
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reading netlist data from a data processing system memory containing information on each of the plurality of devices and their respective connections within the circuit; reading a plurality of input state data from said data processing system memory, each input state specifying input signals provided to the circuit; reading input state weight data specifying occurrence information for individual input signal data; determining which devices in the circuit are in an OFF state for each of the plurality of input states; computing leakage current for each device in the OFF state according to the device position in the circuit for each of the plurality of input states and the input state weight data; and providing to a data processing system display resulting leakage information for each input state.
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11. A method performed in a data processing system for determining leakage current in a CMOS circuit having a plurality of devices comprising the steps of:
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reading netlist data from a data processing system memory containing information on each of the plurality of devices and their respective connections within the circuit; reading a plurality of input state data from said data processing system memory, each input state specifying input signals provided to the circuit; determining which devices in the circuit are in an OFF state for each of the plurality of input states; computing leakage current for each device in the OFF state according to the device position in the circuit for each of the plurality of input states and by combining any two devices that have the same source and drain connections if the devices are either both ON or OFF and replacing the two devices with a single device having a sum of their channel widths; and providing to a data processing system display resulting leakage information for each input state.
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12. A computer program product stored in a computer operable non-transitory media, the computer operable non-transitory media containing instructions for execution by a computer, which, when executed by the computer, cause the computer to implement a method for determining leakage current in a CMOS circuit having a plurality of devices, the method comprising the steps of:
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reading netlist data containing information on each of the plurality of devices and their respective connections within the circuit; reading a plurality of input state data, each input state specifying input signals provided to the circuit; determining which devices in the circuit are in an OFF state for each of the plurality of input stat; computing leakage current for only each device in the OFF state according to the device position in the circuit for each of the plurality of input states and that do not have the same source and drain; and providing resulting leakage information for each input state. - View Dependent Claims (13, 14, 15, 16)
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17. A computer program product stored in a computer operable non-transitory media, the computer operable non-transitory media containing instructions for execution by a computer, which, when executed by the computer, cause the computer to implement a method for determining leakage current in a CMOS circuit having a plurality of devices, the method comprising the steps of:
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reading netlist data containing information on each of the plurality of devices and their respective connections within the circuit; reading a plurality of input state data, each input state specifying input signals provided to the circuit; determining which devices in the circuit are in an OFF state for each of the plurality of input state; computing leakage current for each device in the OFF state according to the device position in the circuit for each of the plurality of input states and by combining any two devices that have the same source and drain connections if the devices are either both ON or OFF and replacing the two devices with a single device having a sum of their channel widths; and providing resulting leakage information for each input state.
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18. A data processing system comprising:
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a keyboard; a display; a processor connected to the keyboard and the display and including an execution unit and a program memory containing a program method for determining leakage current in a CMOS circuit having a plurality of devices, the program method comprising the steps of; reading netlist data containing information on each of the plurality of devices and their respective connections within the circuit; reading a plurality of input state data, each input state specifying input signals provided to the circuit; determining which devices in the circuit are in an OFF state for each of the plurality of input state; computing leakage current only for each device in the OFF state according to the device position in the circuit for each of the plurality of input states and that do not have the same source and drain; and providing resulting leakage information for each input state.
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Specification