Methods and systems for calibration of RFID sensors
First Claim
1. A method for calibration of an RFID sensor used in manufacturing and monitoring systems comprising:
- measuring complex impedance of an RFID sensor antenna;
relating the measurement of impedance of the RFID sensor antenna to one or more parameters;
computing one or more analytical fit coefficients;
storing the one or more analytical fit coefficients on a memory chip of the RFID sensor; and
wherein measuring complex impedance comprises measuring at least one of frequency of magnitude of the real part of the complex impedance, resonance peak position of the real part of the complex impedance, resonant frequency of the imaginary part of the complex impedance, antiresonant frequency of the imaginary part of the complex impedance, zero-reactance frequency, quality factor of resonance, peak width, and peak symmetry of the complex impedance response of the antenna.
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Accused Products
Abstract
Methods and systems for calibration of RFID sensors used in manufacturing and monitoring systems are provided. The methods include measuring impedance of an RFID sensor antenna, relating the measurement of impedance to one or more parameters (such as physical, chemical and biological properties), computing one or more analytical fit coefficients, and storing the one or more analytical fit coefficients on a memory chip of the RFID sensor. Measuring impedance of the RFID sensor may comprise measuring complex impedance which involves measuring complex impedance spectrum, phase angle and magnitude of the impedance, at least one of frequency of the maximum of the real part of the complex impedance, magnitude of the real part of the complex impedance, zero-reactance frequency, resonant frequency of the imaginary part of the complex impedance, and antiresonant frequency of the imaginary part of the complex impedance. Also provided are manufacturing or monitoring systems comprised of an RFID sensor wherein the RFID sensor comprises, a memory chip, an antenna, and a sensing film wherein analytical fit coefficients are stored on the memory chip to allow calibration of the RFID sensor. Also provided are manufacturing or monitoring systems comprised of an RFID sensor wherein the RFID sensor comprises, a memory chip, an antenna, and a complementary sensor attached to the antenna where the complementary sensor in a pre-calibrated fashion predictably affects the impedance of the antenna.
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Citations
29 Claims
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1. A method for calibration of an RFID sensor used in manufacturing and monitoring systems comprising:
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measuring complex impedance of an RFID sensor antenna; relating the measurement of impedance of the RFID sensor antenna to one or more parameters; computing one or more analytical fit coefficients; storing the one or more analytical fit coefficients on a memory chip of the RFID sensor; and wherein measuring complex impedance comprises measuring at least one of frequency of magnitude of the real part of the complex impedance, resonance peak position of the real part of the complex impedance, resonant frequency of the imaginary part of the complex impedance, antiresonant frequency of the imaginary part of the complex impedance, zero-reactance frequency, quality factor of resonance, peak width, and peak symmetry of the complex impedance response of the antenna. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21)
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22. A manufacturing or monitoring system comprising an RFID sensor wherein the RFID sensor comprises:
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a memory chip; an antenna; a complementary sensor; and wherein the complementary sensor is configured to provide a measured response to a change in a parameter and the measured response is selected from the group consisting of a change in the resistance of the complementary sensor, a change in capacitance of the complementary sensor, a change in inductance of the complementary sensor and combinations thereof. - View Dependent Claims (23, 24, 25, 26, 27, 28, 29)
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Specification